Sample holder for an optical element
    2.
    发明授权
    Sample holder for an optical element 有权
    用于光学元件的样品架

    公开(公告)号:US07746465B2

    公开(公告)日:2010-06-29

    申请号:US11966557

    申请日:2007-12-28

    申请人: Douglas C. Mark

    发明人: Douglas C. Mark

    IPC分类号: G01N21/01

    摘要: The sample holder includes support having a thickness and an aperture through the thickness of the support. A tilt mechanism is connected to the support for controlled tilting of the support, and the aperture through the support is configured to have a diameter that increases in a direction through the thickness of the support. This arrangement enables a light beam to pass through the same given area of the sample, irrespective of whether the sample is held perpendicular to the beam or held at a tilted position relative to the beam. In one embodiment, the holder includes an efficient magnetic clamp mechanism for securing the sample to the holder. The holder compactly integrates with tilting mechanisms a sample rotation mechanism.

    摘要翻译: 样品保持器包括具有穿过支撑件的厚度的厚度和孔径的支撑件。 倾斜机构连接到支撑件以用于支撑件的受控倾斜,并且通过支撑件的孔被构造成具有在穿过支撑件的厚度的方向上增加的直径。 这种布置使得光束能够通过样品的相同的给定区域,而不管样品是保持垂直于光束还是保持在相对于光束的倾斜位置。 在一个实施例中,保持器包括用于将样品固定到保持器的有效的磁性夹紧机构。 夹持器与倾斜机构紧密地集成了样品旋转机构。

    Sample Holder for an Optical Element
    3.
    发明申请
    Sample Holder for an Optical Element 有权
    光学元件样品架

    公开(公告)号:US20080174773A1

    公开(公告)日:2008-07-24

    申请号:US11966557

    申请日:2007-12-28

    申请人: Douglas C. Mark

    发明人: Douglas C. Mark

    IPC分类号: G01N21/01

    摘要: The sample holder includes support having a thickness and an aperture through the thickness of the support. A tilt mechanism is connected to the support for controlled tilting of the support, and the aperture through the support is configured to have a diameter that increases in a direction through the thickness of the support. This arrangement enables a light beam to pass through the same given area of the sample, irrespective of whether the sample is held perpendicular to the beam or held at a tilted position relative to the beam. In one embodiment, the holder includes an efficient magnetic clamp mechanism for securing the sample to the holder. The holder compactly integrates with tilting mechanisms a sample rotation mechanism.

    摘要翻译: 样品保持器包括具有穿过支撑件的厚度的厚度和孔径的支撑件。 倾斜机构连接到支撑件以用于支撑件的受控倾斜,并且通过支撑件的孔被构造成具有在穿过支撑件的厚度的方向上增加的直径。 这种布置使得光束能够通过样品的相同的给定区域,而不管样品是保持垂直于光束还是保持在相对于光束的倾斜位置。 在一个实施例中,保持器包括用于将样品固定到保持器的有效的磁性夹紧机构。 夹持器与倾斜机构紧密地集成了样品旋转机构。

    Birefringence measurement of large-format samples
    4.
    发明授权
    Birefringence measurement of large-format samples 失效
    大幅面样品的双折射测量

    公开(公告)号:US06992758B2

    公开(公告)日:2006-01-31

    申请号:US10359529

    申请日:2003-02-05

    IPC分类号: G01N21/01

    摘要: The disclosure is directed to systems and methods for precisely measuring birefringence properties of large-format samples of optical elements. A gantry-like configuration is employed for precise movement of birefringence measurement system components relative to the sample. There is also provided an effective large-format sample holder that adequately supports the sample to prevent induced birefringence therein while still presenting a large area of the sample to the unhindered passage of light.

    摘要翻译: 本公开涉及用于精确测量大幅面光学元件样品的双折射性质的系统和方法。 双折射测量系统部件相对于样品的精确运动采用了龙门式结构。 还提供了一种有效的大幅面样品保持器,其充分地支撑样品以防止其中引起的双折射,同时仍然将大面积的样品提供给无阻碍的光通过。