公开(公告)号：US20240005848A1

公开(公告)日：2024-01-04

申请号：US18210060

申请日：2023-06-14

Applicant: Apple Inc.

Inventor： Jeongsup Lee ,  Hasan Akyol ,  Xiang Lu ,  Mahdi Farrokh Baroughi ,  Nikhil Acharya ,  Haitao Li ,  Hopil Bae ,  John T Wetherell ,  Shengzhe Jiao ,  Stanley B. Wang ,  Sunmin Jang ,  Hari P. Paudel ,  Eric A. Hildebrandt ,  Young Don Bae

IPC: G09G3/32

CPC classification number: G09G3/32 ,  G09G2300/0819 ,  G09G2300/0852 ,  G09G2310/08

Abstract: An electronic device may include an electronic display including display pixels to display an image based on compensated image data. As image data is written to a pixel in the row of pixels, capacitive coupling at a driver may lead to distortion on the driver. In particular, the capacitive coupling may cause distortion at a storage capacitor, which may lead to current droop at the pixel. The current droop may be reduced or eliminated in each pixel by performing pixel compensation. The pattern of the pixel compensation may be selected such that, over a number of subframes, an average amount of light is the same or similar to what would be emitted had pixel compensation been performed on each pixel in each subframe.

公开(公告)号：US20250095548A1

公开(公告)日：2025-03-20

申请号：US18625162

申请日：2024-04-02

Applicant: Apple Inc.

Inventor： Baris Posat ,  John T Wetherell ,  Hasan Akyol ,  Mahdi Farrokh Baroughi

IPC: G09G3/32 ,  G09G3/20

Abstract: Electronic displays may display a frame of image content by controlling emissions of display pixels. To this end, the electronic display may include one or more column drivers that drive the display pixels to emit light. The column drivers may be collectively compensated by common components, such as a single sampling capacitor and/or an analog buffer, which may reduce a size of the column drivers. In another example, the column drivers may include cascode transistors with increased width-to-length ratio and share a common n-well. Each transistor may be compensated by a respective capacitor, however a size of each sampling capacitor may be reduced, thereby reducing a size of the column driver. Moreover, a size of a level shifter may be reduced by operating transistors of the level shifter with sub-threshold voltage. Furthermore, a resolution of the electronic display may be improved by extending a pulse of an emission clock signal.

公开(公告)号：US20240402237A1

公开(公告)日：2024-12-05

申请号：US18656567

申请日：2024-05-06

Applicant: Apple Inc.

Inventor： Xuebei Yang ,  Chung-Lun E Hsu ,  Cheuk Chi Lo ,  Hasan Akyol ,  Yingkan Lin ,  John T Wetherell ,  Han Zhao

IPC: G01R31/26 ,  H01L21/66

Abstract: Systems and methods are provided for electrical testing to supplement or replace optical testing of an electronic display. Internal testing circuitry that includes analog front end (AFE) and analog-to-digital converter (ADC) circuitry may be included in the electronic display and may be used either alone or in combination with other testing devices to perform electrical characterization and defect screening. The electrical characterization and defect screening may be performed before or after self-emissive elements such as light-emitting diodes are installed, further improving yield. Types of electrical characterization and defect screening may include a partial passive mode electrical characterization of OLEDs, vertical or horizontal crosstalk measurement, scan line integrity testing, pixel bright dot testing, display pixel defect detection, and delayed defect detection for defects that may occur after some extended period of time (e.g., after several minutes, after several hours).