Surface roughness and emissivity determination

    公开(公告)号:US12098914B2

    公开(公告)日:2024-09-24

    申请号:US17936608

    申请日:2022-09-29

    CPC classification number: G01B11/303 G01J5/0003 G01J5/0806 G01J5/0808

    Abstract: A system includes a radiation source configured to emit a radiation beam. The system further includes a first optical sensor configured to detect a first intensity of a first portion of the radiation beam reflected from a surface of an object. The system further includes a second optical sensor configured to detect a second intensity of a second portion of the radiation beam scattered by the surface of the object. The system further includes a processing device communicatively coupled to the first optical sensor and the second optical sensor. The processing device is configured to determine at least one of a roughness or an emissivity of the surface of the object based on a comparison of the first intensity and the second intensity.

    SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION

    公开(公告)号:US20250164238A1

    公开(公告)日:2025-05-22

    申请号:US18511021

    申请日:2023-11-16

    Abstract: A system includes a radiation source configured to emit a radiation beam, a first optical sensor configured to detect a first intensity of a first portion of the radiation beam reflected from a surface of an object, a second optical sensor configured to detect a second intensity of a second portion of the radiation beam scattered by the surface of the object, and a third optical sensor configured to detect a third intensity of a third portion of the radiation beam scattered by the surface of the object. The system further includes a processing device communicatively coupled to the first optical sensor, the second optical sensor, and the third optical sensor. The processing device is configured to determine a roughness or an emissivity of the surface of the object based on a comparison of two or more of the first intensity, the second intensity, or the third intensity.

    SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION

    公开(公告)号:US20240110782A1

    公开(公告)日:2024-04-04

    申请号:US17936608

    申请日:2022-09-29

    CPC classification number: G01B11/303 G01J5/0003 G01J5/0806 G01J5/0808

    Abstract: A system includes a radiation source configured to emit a radiation beam. The system further includes a first optical sensor configured to detect a first intensity of a first portion of the radiation beam reflected from a surface of an object. The system further includes a second optical sensor configured to detect a second intensity of a second portion of the radiation beam scattered by the surface of the object. The system further includes a processing device communicatively coupled to the first optical sensor and the second optical sensor. The processing device is configured to determine at least one of a roughness or an emissivity of the surface of the object based on a comparison of the first intensity and the second intensity.

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