公开(公告)号：US12103079B2

公开(公告)日：2024-10-01

申请号：US17416185

申请日：2019-03-04

Applicant: Arcam AB

Inventor： Jonas Hellgren

IPC: B22F12/49 ,  B22F10/28 ,  B22F10/366 ,  B22F10/85 ,  B22F12/90 ,  B23K26/03 ,  B23K26/046 ,  B23K26/06 ,  B23K26/08 ,  B23K26/082 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y50/02 ,  H04N7/18

CPC classification number: B22F12/49 ,  B22F10/28 ,  B22F10/366 ,  B23K26/032 ,  B23K26/046 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y50/02 ,  H04N7/18 ,  B22F10/85 ,  B22F12/90 ,  B23K26/0665 ,  B23K26/082 ,  B23K26/083

Abstract: An apparatus for forming at least one three-dimensional article through successive fusion of parts of a powder bed, which parts corresponds to successive cross sections of the three-dimensional article, the apparatus comprising: a powder distributor configured for evenly distributing a layer of powder on top of a work table provided inside a build chamber; and at least one high energy beam source emanating at least one high energy beam configured for fusing the powder layer in selected locations corresponding to the cross section of the three-dimensional article, wherein the apparatus further comprising at least one target area arranged spaced apart from the layer of powder for emanating light when irradiated by the at least one high energy beam.

公开(公告)号：US20240066598A1

公开(公告)日：2024-02-29

申请号：US17897294

申请日：2022-08-29

Applicant: Arcam AB

Inventor： Jimmie Jonnor ,  Jonas Hellgren

IPC: B22F10/36 ,  B22F10/28 ,  B22F10/85 ,  B22F12/30 ,  B22F12/41 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y50/02

CPC classification number: B22F10/36 ,  B22F10/28 ,  B22F10/85 ,  B22F12/30 ,  B22F12/41 ,  B33Y10/00 ,  B33Y30/00 ,  B33Y50/02

Abstract: A method of monitoring a spot quality of an electron beam includes directing the electron beam to a first measurement point in a powder layer a plurality of times, adjusting a focus offset of the electron beam each of the plurality of times the electron beam is directed to the first measurement point, measuring x-ray emissions from the first measurement point each of the plurality of times the electron beam is directed to the first measurement point, and determining a drift in a focus or an intensity of the electron beam based on the measured x-ray emissions.