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公开(公告)号：US11204509B2
公开(公告)日：2021-12-21
申请号：US17290163
申请日：2019-10-30
发明人： Dae Wook Kim , Rongguang Liang , Oliver Spires
摘要： A kinematically engaged yoke system (KEYS) for multiple-order-diffraction engineered material may comprise a harness comprising a frame and a plurality of semi-kinematic keys disposed on the frame, wherein the semi-kinematic keys are configured based on a MOD-side mechanical profile of a plurality of segments of a multiple-order-diffraction engineered material, and wherein the MOD-side mechanical profile, when engaged with the semi-kinematic keys, functions as a fiducial that provides alignment between neighboring segments; and one or more shims disposed between one or more pairs of neighboring segments of the plurality of segments of the multiple-order-diffraction engineered material, wherein the one or more shims facilitate alignment of the one or more pairs of neighboring segments of the plurality of segments based on a translation across one or more surfaces of the one or more shims.
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公开(公告)号：US20220299310A1
公开(公告)日：2022-09-22
申请号：US17596439
申请日：2020-06-18
发明人： Dae Wook Kim , Heejoo Choi , Trenton Brendel
摘要： Methods, apparatus and systems for testing an optical element are described. One example device for measuring a test optical component includes a pre-conditioning optical module positioned to receive an optical beam from a light source and to produce a beam having a non-collimated beam profile or a freeform wavefront. The device further includes a beam splitter positioned to receive the beam output from the pre-conditioning optical module and to direct a first portion of the beam to a reference arm configured to accommodate a reference optical component, and to direct a second portion of the beam to a test arm configured to accommodate the test optical component. The device also includes a beam combiner positioned to receive the beams from the reference arm and the test arm after reflection or refraction by the reference and the test optical components.
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公开(公告)号：US20190316898A1
公开(公告)日：2019-10-17
申请号：US16462187
申请日：2017-11-17
发明人： Dae Wook Kim , Isaac Trumper
IPC分类号： G01B11/24
摘要： Provided are instantaneous phase mapping deflectometry measurement systems and methods based on multiplexing phase shifted fringe patterns with color, and decomposing them in X and Y using Fourier techniques. The new methods and devices provide accurate measurements, and more robust tools with less uncertainty when reconstructing a surface (e.g., compared to prior art Fourier Transform Profilometry (FTP) methods). The systems and methods revolutionize the applications of deflectometry by enabling measuring dynamic events (e.g., in high vibration environments, and a host of other previously impossible scenarios), and including environmental changes to the bending modes of large optics. Methods of error correction applicable to the new methods and devices are also provided.
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公开(公告)号：US20230194849A1
公开(公告)日：2023-06-22
申请号：US17879374
申请日：2022-08-02
发明人： Ewan Douglas , Dae Wook Kim
摘要： A versatile space telescope for quantum key distribution and adapted for interfacing with a spacecraft and an instrument module. The telescope includes diamond turned aluminum mirrors at its entrance and exit, adjacent the spacecraft and instrument module, respectively.
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公开(公告)号：US20220212314A1
公开(公告)日：2022-07-07
申请号：US17599403
申请日：2020-04-14
发明人： Dae Wook Kim
摘要： Methods, apparatus and systems for polishing an optical component having an aspheric or freeform surface are described. In one example aspect, a polishing device includes a solid plate and a container coupled to the solid plate. The container encloses a non-Newtonian material that exhibits a solid-like and a fluid-like behavior based on a frequency of a stress applicable to the non-Newtonian material. The device also includes a layer of viscoelastic polymer adhered to the container to polish the optical component. The layer of viscoelastic polymer comprises one or more segments positioned according to a shape of the solid plate.
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公开(公告)号：US20220055945A1
公开(公告)日：2022-02-24
申请号：US17404967
申请日：2021-08-17
发明人： Dae Wook Kim , Heejoo Choi , Marcos Esparza
摘要： Methods, apparatus and systems are described that relate to in-situ and in-process assembly of segmented optical component with high accuracy. One example method for assembling an optical component with multiple segments includes positioning the multiple segments to an initial state conforming to an alignment or positioning requirement, measuring positions of the multiple segments at the initial state, initiating a fusing process to fuse the multiple segments of the optical element together, measuring the positions of the multiple segments after commencement of the fusing process, and determining whether a change in the positions of the multiple segments has occurred that causes a deviation from the initial state. Upon a determination that the deviation is not within a tolerance value, the method includes adjusting a position of at least one of the multiple segments to maintain the deviation within the tolerance value.
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7.发明申请公开(公告)号：US20210318550A1
公开(公告)日：2021-10-14
申请号：US17290163
申请日：2019-10-30
发明人： Dae Wook Kim , Rongguang Liang , Oliver Spires
摘要： A kinematically engaged yoke system (KEYS) for multiple-order-diffraction engineered material may comprise a harness comprising a frame and a plurality of semi-kinematic keys disposed on the frame, wherein the semi-kinematic keys are configured based on a MOD-side mechanical profile of a plurality of segments of a multiple-order-diffraction engineered material, and wherein the MOD-side mechanical profile, when engaged with the semi-kinematic keys, functions as a fiducial that provides alignment between neighboring segments; and one or more shims disposed between one or more pairs of neighboring segments of the plurality of segments of the multiple-order-diffraction engineered material, wherein the one or more shims facilitate alignment of the one or more pairs of neighboring segments of the plurality of segments based on a translation across one or more surfaces of the one or more shims.
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公开(公告)号：US10731972B2
公开(公告)日：2020-08-04
申请号：US16462187
申请日：2017-11-17
发明人： Dae Wook Kim , Isaac Trumper
IPC分类号： G01B11/24
摘要： Provided are instantaneous phase mapping deflectometry measurement systems and methods based on multiplexing phase shifted fringe patterns with color, and decomposing them in X and Y using Fourier techniques. The new methods and devices provide accurate measurements, and more robust tools with less uncertainty when reconstructing a surface (e.g., compared to prior art Fourier Transform Profilometry (FTP) methods). The systems and methods revolutionize the applications of deflectometry by enabling measuring dynamic events (e.g., in high vibration environments, and a host of other previously impossible scenarios), and including environmental changes to the bending modes of large optics. Methods of error correction applicable to the new methods and devices are also provided.
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公开(公告)号：US12092456B2
公开(公告)日：2024-09-17
申请号：US17596439
申请日：2020-06-18
发明人： Dae Wook Kim , Heejoo Choi , Trenton Brendel
CPC分类号： G01B9/02039 , G01M11/0271
摘要： Methods, apparatus and systems for testing an optical element are described. One example device for measuring a test optical component includes a pre-conditioning optical module positioned to receive an optical beam from a light source and to produce a beam having a non-collimated beam profile or a freeform wavefront. The device further includes a beam splitter positioned to receive the beam output from the pre-conditioning optical module and to direct a first portion of the beam to a reference arm configured to accommodate a reference optical component, and to direct a second portion of the beam to a test arm configured to accommodate the test optical component. The device also includes a beam combiner positioned to receive the beams from the reference arm and the test arm after reflection or refraction by the reference and the test optical components.
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公开(公告)号：US12085473B2
公开(公告)日：2024-09-10
申请号：US17430635
申请日：2020-02-24
CPC分类号： G01M11/025 , G01N21/8806 , G01N2021/8829
摘要： Devices, methods and systems are disclosed that enable deflectometry on a wide array of objects, including convex and freeform optical components. One example deflectometry system includes a light source with a plurality of light emitting devices to illuminate an object under test with incident light, and a detector positioned to receive a reflected or transmitted light from the object under test. The deflectometry system further includes a movable stage for holding or securing the object under test. The movable stage can move in a translational or a rotational direction to cause the object under test to translate or rotate in a plurality of steps such that the light received at the detector encompasses a portion of a full illumination space surrounding the object, and the light received at the detector from all of the plurality of steps encompasses the full illumination space that contiguously surrounds the object under test.
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