公开(公告)号：US11480613B2

公开(公告)日：2022-10-25

申请号：US17127846

申请日：2020-12-18

Applicant: Arm Limited

Inventor： Richard Andrew Paterson ,  Rainer Herberholz ,  Peter Andrew Rees Williams ,  Oded Golombek ,  Einat Luko ,  Jeffrey Scott Boyer

IPC: G01R31/3177 ,  G01R31/3187 ,  G01R31/317 ,  G01R31/3185 ,  G01R31/28 ,  H04L9/08

Abstract: Disclosed are methods, systems and devices for implementing built-in self-test (BIST) to be performed by an untrusted party and/or in an unsecure testing environment. In an embodiment, a test access port (TAP) on a device may enable a party to initiate execution of one or more BIST procedures on the device. Additionally, such a TAP may enable loading of encrypted instructions to be executed by one or more processors formed on a device under test.

公开(公告)号：US20220196734A1

公开(公告)日：2022-06-23

申请号：US17127846

申请日：2020-12-18

Applicant: Arm Limited

Inventor： Richard Andrew Paterson ,  Rainer Herberholz ,  Peter Andrew Rees Williams ,  Oded Golombek ,  Einat Luko ,  Jeffrey Scott Boyer

IPC: G01R31/3177 ,  G01R31/317

Abstract: Disclosed are methods, systems and devices for implementing built-in self-test (BIST) to be performed by an untrusted party and/or in an unsecure testing environment. In an embodiment, a test access port (TAP) on a device may enable a party to initiate execution of one or more BIST procedures on the device. Additionally, such a TAP may enable loading of encrypted instructions to be executed by one or more processors formed on a device under test.