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公开(公告)号:US20210324516A1
公开(公告)日:2021-10-21
申请号:US17259666
申请日:2019-07-04
Applicant: BASF SE
Inventor: David Dominique SCHWEINFURTH , Lukas MAYR , Sinja Verena KLENK , David SCHESCHKEWITZ , Kinga Izabela LESZCZYNSKA
IPC: C23C16/455 , C23C16/18 , C23C16/34 , C23C16/32 , C23C16/36
Abstract: The present invention is in the field of processes for the generation of thin inorganic films on substrates, in particular atomic layer deposition processes. It relates to a process for preparing metal- or semimetal-containing films comprising (a) depositing a metal- or semimetal-containing compound from the gaseous state onto a solid substrate and (b) bringing the solid substrate with the deposited metal- or semimetal-containing compound in contact with compound of general formula (II), (III), or (IV), wherein E is Ge or Sn, R is an alkyl group, an alkenyl group, an aryl group, or a silyl group, R′ are an alkyl group, an alkenyl group, an aryl group, or a silyl group, X is nothing, hydrogen, a halide, an alkyl group, an alkylene group, an aryl group, an alkoxy group, an aryl oxy group, an amino group, or a amidinate group, or an guanidinate group, L is an alkyl group, an alkenyl group, an aryl group, or a silyl group.
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公开(公告)号:US20190309417A1
公开(公告)日:2019-10-10
申请号:US16338915
申请日:2017-10-18
Applicant: BASF SE
Inventor: Maraike AHLF , David Dominique SCHWEINFURTH , Lukas MAYR , Kinga Izabela LESZCZYNSKA , David SCHESCHKEWITZ
IPC: C23C16/455 , C23C16/32 , C23C16/34 , C23C16/38 , C23C16/40
Abstract: The present invention is in the field of processes for the generation of thin inorganic films on substrates. In particular, the present invention relates to a process comprising depositing the compound of general formula (I) onto a solid substrate, wherein R1, R2, R3, R4, and R5 is hydrogen, an alkyl group, an alkenyl group, an aryl group or a silyl group, wherein not more than three of R1, R2, R3, R4, and R5 are hydrogen, X is a group which binds to silicon, m is 1 or 2, n is 0, 1, or 2, and Si is in the oxidation state +2.
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