公开(公告)号：US20230195945A1

公开(公告)日：2023-06-22

申请号：US17864714

申请日：2022-07-14

Applicant: BEIJING BAIDU NETCOM SCIENCE TECHNOLOGY CO., LTD.

Inventor： Yan LI

IPC: G06F21/76 ,  G06F7/483

CPC classification number: G06F21/76 ,  G06F7/483

Abstract: The present disclosure provides an integrated circuit (IC) chip verification method and apparatus, an electronic device, and a storage medium, and relates to the field of artificial intelligence such as artificial intelligence chips and cloud computing. The method may include: acquiring a first parameter and a second parameter, the first parameter being an upper limit of a required floating-point number, and the second parameter being a lower limit of the required floating-point number; generating a first sign, a first exponent, and a first fraction of a randomized floating-point number respectively according to the first parameter and the second parameter; generating the floating-point number according to the first sign, the first exponent, and the first fraction; and performing IC chip verification by using the floating-point number.