公开(公告)号：US20060067470A1

公开(公告)日：2006-03-30

申请号：US10520777

申请日：2003-07-14

申请人： Bi-Cheng Wang ,  Zheng-Qing Fu ,  John Rose

发明人： Bi-Cheng Wang ,  Zheng-Qing Fu ,  John Rose

IPC分类号： G01N23/207

CPC分类号： G01N23/207 ,  G01N23/2076

摘要： The present invention relates to methods of diffractometrically determining the structures of materials by characterizing their electron density distributions. More particularly, the present invention relates to methods of collecting, processing and interpreting X-ray diffraction data, which allow real time evaluation of the signal-to-noise ratio in crystal diffraction experiments. The present methods related to the derivation of statistical indices for monitoring and evaluating signal-to-noise ratios in diffraction experiments. In addition, the present invention provides methods of determining the electron density distributions of crystals using anomalous scattering signals corrected for noise. Further, the present invention provides methods of increasing the signal-to-noise ratios in X-ray diffraction data.

摘要翻译： 本发明涉及通过表征其电子密度分布来衍射材料的结构的方法。 更具体地，本发明涉及收集，处理和解释X射线衍射数据的方法，其允许在晶体衍射实验中实时评估信噪比。 本方法与衍射实验中监测和评估信噪比的统计指标的推导有关。 此外，本发明提供了使用针对噪声进行校正的异常散射信号来确定晶体的电子密度分布的方法。 此外，本发明提供了增加X射线衍射数据中的信噪比的方法。