利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

6 条记录 (耗时 0.031 秒)

    Monitoring signal-to-noise ratio in x-ray diffraction data
    1.
    发明申请
    Monitoring signal-to-noise ratio in x-ray diffraction data 审中-公开
    监测x射线衍射数据中的信噪比

    公开(公告)号：US20060067470A1

    公开(公告)日：2006-03-30

    申请号：US10520777

    申请日：2003-07-14

    申请人： Bi-Cheng Wang ,  Zheng-Qing Fu ,  John Rose

    发明人： Bi-Cheng Wang ,  Zheng-Qing Fu ,  John Rose

    IPC分类号： G01N23/207

    CPC分类号： G01N23/207 ,  G01N23/2076

    摘要： The present invention relates to methods of diffractometrically determining the structures of materials by characterizing their electron density distributions. More particularly, the present invention relates to methods of collecting, processing and interpreting X-ray diffraction data, which allow real time evaluation of the signal-to-noise ratio in crystal diffraction experiments. The present methods related to the derivation of statistical indices for monitoring and evaluating signal-to-noise ratios in diffraction experiments. In addition, the present invention provides methods of determining the electron density distributions of crystals using anomalous scattering signals corrected for noise. Further, the present invention provides methods of increasing the signal-to-noise ratios in X-ray diffraction data.

    摘要翻译： 本发明涉及通过表征其电子密度分布来衍射材料的结构的方法。 更具体地，本发明涉及收集，处理和解释X射线衍射数据的方法，其允许在晶体衍射实验中实时评估信噪比。 本方法与衍射实验中监测和评估信噪比的统计指标的推导有关。 此外，本发明提供了使用针对噪声进行校正的异常散射信号来确定晶体的电子密度分布的方法。 此外，本发明提供了增加X射线衍射数据中的信噪比的方法。

    High-throughput methods for determining electron density distributions and structures of crystals
    2.
    发明申请
    High-throughput methods for determining electron density distributions and structures of crystals 审中-公开
    用于确定电子密度分布和晶体结构的高通量方法

    公开(公告)号：US20060029184A1

    公开(公告)日：2006-02-09

    申请号：US11213619

    申请日：2005-08-26

    申请人： Dawei Lin ,  Zhi-Jie Liu ,  Jeremy Praissman ,  John Rose ,  Wolfram Tempel ,  Bi-Cheng Wang

    发明人： Dawei Lin ,  Zhi-Jie Liu ,  Jeremy Praissman ,  John Rose ,  Wolfram Tempel ,  Bi-Cheng Wang

    IPC分类号： G01N23/207

    CPC分类号： G01N23/207 ,  G01N2223/0566 ,  G16B15/00 ,  G16B50/00 ,  G16C20/20

    摘要： Disclosed are high-throughput methods for determining crystal structures from X-ray diffraction data, for example high-throughput crystal structure determination methods employing flexible, high-throughput modular computational pipelines, such as Bioperl computational pipelines. High-throughput methods for determining crystal structures can be fully or partially automated, and can be fully or partially computer executed. Crystal structure determination methods employing a pipeline interface, work flow manager and/or output parsers can be used to optimize the amount of structural information derived from an X-ray diffraction data set and increase the efficiency of calculating crystal structures from X-ray diffraction data.

    摘要翻译： 公开了用于从X射线衍射数据确定晶体结构的高通量方法，例如采用灵活的高通量模块计算管线（例如Bioperl计算管线）的高通量晶体结构确定方法。 用于确定晶体结构的高通量方法可以完全或部分自动化，并且可以完全或部分地计算机执行。 可以使用采用流水线接口，工作流程管理器和/或输出解析器的晶体结构确定方法来优化从X射线衍射数据集得到的结构信息量，并且增加从X射线衍射数据计算晶体结构的效率 。