公开(公告)号：US07426669B2

公开(公告)日：2008-09-16

申请号：US10853768

申请日：2004-10-14

申请人： Björn Flach ,  Andreas Logisch ,  Wolfgang Ruf ,  Michael Schittenhelm ,  Martin Schnell

发明人： Björn Flach ,  Andreas Logisch ,  Wolfgang Ruf ,  Michael Schittenhelm ,  Martin Schnell

IPC分类号： G01R31/28

CPC分类号： G11C29/4401 ,  G01R31/31723 ,  G11C29/16 ,  G11C2029/4402

摘要： The invention provides a method for testing circuit units to be tested in a test apparatus, different identification units being assigned to the circuit units to be tested, the circuit units to be tested being connected to the test apparatus, a tester data stream including command blocks being output from the test apparatus, the tester data stream being compared with the identification units, the circuit unit to be tested, the identification unit of which matches the tester data stream output by the test apparatus, being activated and at least one command block for this circuit unit to be tested being processed in the circuit unit to be tested, whereupon the circuit unit to be tested is deactivated.

摘要翻译： 本发明提供了一种用于测试在测试设备中测试的电路单元的方法，将不同的识别单元分配给要测试的电路单元，待测试的电路单元连接到测试设备，测试器数据流包括命令块 从测试装置输出，将测试器数据流与识别单元，被测试的电路单元，识别单元与被测试设备输出的测试仪数据流相匹配的电路单元，以及至少一个命令块，用于 待测试的电路单元在要测试的电路单元中被处理，于是被测试的电路单元被去激活。

公开(公告)号：US06777924B2

公开(公告)日：2004-08-17

申请号：US10377348

申请日：2003-02-28

申请人： Björn Flach ,  Wolfgang Ruf ,  Martin Schnell ,  Jörg Stippler ,  Andreas Logisch

发明人： Björn Flach ,  Wolfgang Ruf ,  Martin Schnell ,  Jörg Stippler ,  Andreas Logisch

IPC分类号： G01R104

CPC分类号： G01R31/2853

摘要： A method and device allow testing functionally identical semiconductor devices on a programmable testing device. The semiconductor devices are placed in magazine devices and a uniform magazine interface with respect to the testing device is provided for similar semiconductor devices in different types of packages. The semiconductor devices are advantageously tested one after the other on a testing device essentially without deference to their type of package and without any mechanical conversions being necessary on the testing device.

摘要翻译： 一种方法和装置允许在可编程测试装置上测试功能上相同的半导体器件。 半导体器件被放置在盒装置中，并且针对不同类型的封装件的类似的半导体器件提供了相对于测试装置的统一的盒子接口。 半导体器件有利地在测试装置上一个接一个地测试，基本上不依赖于它们的封装类型，并且在测试装置上不需要任何机械转换。

公开(公告)号：US07360139B2

公开(公告)日：2008-04-15

申请号：US11257401

申请日：2005-10-25

申请人： Andreas Logisch ,  Mónica De Castro Martins ,  Björn Flach ,  Wolfgang Ruf ,  Martin Schnell ,  Ana Leao

发明人： Andreas Logisch ,  Mónica De Castro Martins ,  Björn Flach ,  Wolfgang Ruf ,  Martin Schnell ,  Ana Leao

IPC分类号： G01R31/28 ,  G06F11/00

CPC分类号： G11C29/028 ,  G11C29/56

摘要： A tester for semiconductor components with a plurality of channels is connected to a specific semiconductor component in order to characterize the signal path between tester and semiconductor component under production conditions. The specific semiconductor component includes measuring units that are connected to connection contacts and in each case provide the functionality of a signal generator, a signal detector, a digital communication interface and a receiving unit for trigger signals. The specific semiconductor component further includes a trigger logic to convey trigger signals between the receiving unit of a first one and the signal generator or detector of a second one of the measuring units.

摘要翻译： 具有多个通道的半导体部件的测试器连接到特定的半导体部件，以便在生产条件下表征测试仪和半导体部件之间的信号路径。 特定的半导体部件包括连接到连接触点的测量单元，并且在每种情况下提供信号发生器，信号检测器，数字通信接口和用于触发信号的接收单元的功能。 特定半导体部件还包括用于在第一个的接收单元和第二个测量单元的信号发生器或检测器之间传送触发信号的触发逻辑。

公开(公告)号：US07414421B2

公开(公告)日：2008-08-19

申请号：US11290138

申请日：2005-11-30

申请人： Björn Flach ,  Andreas Logisch ,  Monica De Castro Martins ,  Wolfgang Ruf ,  Martin Schnell

发明人： Björn Flach ,  Andreas Logisch ,  Monica De Castro Martins ,  Wolfgang Ruf ,  Martin Schnell

IPC分类号： G01R31/02

CPC分类号： G01R35/005 ,  G11C29/56 ,  G11C2029/5602

摘要： An insertable calibration device for a programmable tester apparatus comprises at least one calibration unit and a control unit. The progammable tester apparatus is configured to test at least one electronic device with electronic circuits. The progammable tester apparatus comprises a holding device, contact-making devices for the electronic device, and tester channels for coupling in signals to the electronic device. The calibration unit is connected to a first tester channel to be calibrated. The calibration unit is configured to detect a calibration signal edge of a calibration signal that is transmitted by the tester apparatus at a certain transmission instant, to detect a reference signal edge of a reference signal that is transmitted by the tester apparatus via a second tester channel at a reference instant, to compare the instants at which the two signal edges arrive, and to output a comparison result. The control unit evaluates the comparison results and can be used to program the transmission instants in such a way that the instants at which the calibration signal edge and the reference signal edge arrive, for the compensation of signal propagation time differences, are substantially identical. The calibration device has the same form and connections as the electric device and is insertable into the holding device with an accurate fit instead of the electronic device.

摘要翻译： 用于可编程测试仪器的可插入校准装置包括至少一个校准单元和控制单元。 可程序测试仪装置被配置为使用电子电路测试至少一个电子设备。 可程序测试仪器包括保持装置，用于电子装置的接触装置和用于将信号耦合到电子装置的测试仪通道。 校准单元连接到要校准的第一测试仪通道。 校准单元被配置为检测在某一传输时刻由测试仪器发送的校准信号的校准信号边沿，以检测由测试仪器通过第二测试器通道发送的参考信号的参考信号边沿 在参考时刻，比较两个信号边缘到达的时刻，并输出比较结果。 控制单元评估比较结果，并且可以用于对传输时刻进行编程，使得校准信号边沿和参考信号边缘到达的时刻用于信号传播时间差的补偿基本相同。 校准装置具有与电气装置相同的形式和连接，并且可以精确配合而不是电子装置插入到保持装置中。