FRET-BASED ANALYTES DETECTION AND RELATED METHODS AND SYSTEMS
    2.
    发明申请
    FRET-BASED ANALYTES DETECTION AND RELATED METHODS AND SYSTEMS 审中-公开
    基于FRET的分析检测及相关方法和系统

    公开(公告)号:US20150167092A1

    公开(公告)日:2015-06-18

    申请号:US14633094

    申请日:2015-02-26

    IPC分类号: C12Q1/68

    摘要: FRET-based analytes detection and related methods and systems are described where a pair of FRET labeled primers and/or oligonucleotides are used that are specific for target sequences located at a distance up to four time the Förster distance of the FRET chromophores presented on the FRET labeled primers and/or oligonucleotides one with respect to the other in one or more polynucleotide analyte; in particular the pair of FRET labeled primers and/or oligonucleotides is combined with a sample and subjected to one or more polynucleotide amplification reactions before measuring FRET signals from at least one FRET chromophore.

    摘要翻译: 描述了基于FRET的分析物检测和相关方法和系统,其中使用一对FRET标记的引物和/或寡核苷酸,其特异于靶向序列,其位于与FRET上呈现的FRET发色团的Förster距离的四倍 在一个或多个多核苷酸分析物中相对于另一个标记的引物和/或寡核苷酸; 特别地,一对FRET标记的引物和/或寡核苷酸与样品组合,并在测量来自至少一种FRET生色团的FRET信号之前进行一个或多个多核苷酸扩增反应。

    SILICON-ON-INSULATOR CHANNELS
    3.
    发明申请
    SILICON-ON-INSULATOR CHANNELS 有权
    绝缘体绝缘子通道

    公开(公告)号:US20140256114A1

    公开(公告)日:2014-09-11

    申请号:US14186839

    申请日:2014-02-21

    IPC分类号: H01L21/762

    CPC分类号: H01L21/76283 H01L21/762

    摘要: Novel methods to fabricate biological sensors and electronics are disclosed. A silicon-on-insulator wafer can be employed by etching a pattern of holes in the silicon layer, then a pattern of cavities in the insulating layer, and then sealing the top of the cavities. Further, n or p doped regions and metallic regions can be defined in the processed wafer, thereby enabling integration of biological sensing and electronic capabilities in the same wafer.

    摘要翻译: 公开了制造生物传感器和电子学的新方法。 可以通过蚀刻硅层中的孔的图案,然后在绝缘层中蚀刻空腔的图案,然后密封空腔的顶部来采用绝缘体上硅晶片。 此外,可以在经处理的晶片中限定n或p个掺杂区域和金属区域,从而使生物感测和电子能力能够集成在相同的晶片中。