摘要:
A semiconductor device includes a bit-line sense amplifier (S/A) circuit configured to sense and amplify data stored in a resistive memory cell according to a reference current. The bit-line S/A circuit includes a cross-coupled latch circuit and a write latch circuit. The cross-coupled latch circuit is coupled to an input/output circuit via a first line and a complementary first line. The cross-coupled latch circuit is configured to receive write data via the first line, and to latch the write data during a data write operation. The write latch circuit is coupled to the cross-coupled latch circuit, and configured to store the write data in the resistive memory cell via a second line during the data write operation.
摘要:
A magneto-resistive random access memory (MRAM) comprising an MRAM cell array having an MRAM cell, and a control and voltage generation unit configured to generate a back bias voltage for the MRAM cell. The control and voltage generation unit comprising a command decoder configured to generate a decoding signal in response to a command output from a memory controller, and a voltage controller and generator configured to generate the back bias voltage with a magnitude based on the decoding signal and a reset signal output from the memory controller.