公开(公告)号：US20170315152A1

公开(公告)日：2017-11-02

申请号：US15393327

申请日：2016-12-29

Applicant: CHUNGHWA PRECISION TEST TECH. CO., LTD.

Inventor： Cheng-Juei LIN ,  Wen Tsung LI ,  Yuan - Chiang TENG ,  Kai Chieh HSIEH

IPC: G01R1/073 ,  H01L21/48 ,  G01R1/04

CPC classification number: G01R1/07378 ,  G01R1/0491

Abstract: A stack type test interface board assembly is provided herein, which comprises: a space transform board having a narrow pitch transform board and a wide pitch transform board, a plurality of first connection nodes disposed on a side of the narrow pitch transform board to be electrically connected to a finished or semi-finished semiconductor product, a plurality of second connection nodes disposed on a side of the wide pitch transform board, and a printed circuit board where a side thereof is electrically connected to the plurality of the second connection nodes. The narrow pitch transform board and the wide pitch transform board are assembled in perpendicular stack into the space transform board. A pitch between each two of the plurality of the first connection nodes is smaller than a pitch between each two of the plurality of the second connection nodes.