公开(公告)号：US10545173B2

公开(公告)日：2020-01-28

申请号：US15039836

申请日：2014-11-26

Applicant: COMMSCOPE CONNECTIVITY UK LIMITED

Inventor： Gordon John White ,  Bernard Harold Hammond, Jr. ,  Ian Robert George

IPC: G01R1/04 ,  G01R1/067 ,  G01R1/073

Abstract: A test fixture and method of its use are disclosed. The test fixture includes a test fixture frame including a first test fixture mount having a first test head mounted thereon, the first test head slidable along a first axis, and a second test fixture mount having a second test head mounted thereon that is slidable along a second axis perpendicular to the first axis. The test fixture further includes a first test plate holder mounted to the first test head and including a clamping mechanism, as well as a probe mounting plate mounted to the first test plate holder and retained by the clamping mechanism and including a plurality of radially-disposed probe receptacles. The test fixture includes a plurality of probe assemblies received in corresponding probe receptacles, each including a probe extending at least partially through the probe mounting plate, each electrically connecting to a design under test.

公开(公告)号：US10481194B2

公开(公告)日：2019-11-19

申请号：US15026693

申请日：2014-10-02

Applicant: COMMSCOPE CONNECTIVITY UK LIMITED

Inventor： Ian Robert George ,  Bernard Harold Hammond, Jr. ,  Jacob Meachen ,  Gordon John White

IPC: G01R31/04 ,  G01R1/04 ,  G01R31/28

Abstract: A test station and method of testing a design under test are disclosed. One method includes applying a first test frequency signal to a reference path to determine a first known attenuation level, and applying the first test frequency signal to a design under test to determine a first tested attenuation level of the design under test at the first test frequency. The method also includes applying a second test frequency signal to the reference path to determine a second known attenuation level, and applying the second test frequency signal to the design under test to determine a second tested attenuation level of the design under test at the second test frequency. The method includes determining whether the design under test is faulty based on the first tested attenuation level and the second tested attenuation level.