Balunless test fixture
    1.
    发明授权

    公开(公告)号:US10545173B2

    公开(公告)日:2020-01-28

    申请号:US15039836

    申请日:2014-11-26

    Abstract: A test fixture and method of its use are disclosed. The test fixture includes a test fixture frame including a first test fixture mount having a first test head mounted thereon, the first test head slidable along a first axis, and a second test fixture mount having a second test head mounted thereon that is slidable along a second axis perpendicular to the first axis. The test fixture further includes a first test plate holder mounted to the first test head and including a clamping mechanism, as well as a probe mounting plate mounted to the first test plate holder and retained by the clamping mechanism and including a plurality of radially-disposed probe receptacles. The test fixture includes a plurality of probe assemblies received in corresponding probe receptacles, each including a probe extending at least partially through the probe mounting plate, each electrically connecting to a design under test.

    Connector with capacitive crosstalk compensation to reduce alien crosstalk

    公开(公告)号:US10530098B2

    公开(公告)日:2020-01-07

    申请号:US16227678

    申请日:2018-12-20

    Abstract: The present disclosure relates to a telecommunications connector having cross-talk compensations, and a method of managing alien crosstalk in such a connector. In one example, the telecommunications connector includes electrical conductors arranged in differential pairs and a circuit board with conductive layers that provide a cross-talk compensation arrangement for applying capacitance between the electrical conductors. The circuit board includes conductive paths that provide capacitive coupling and a conductive plate that intensifies capacitive coupling of the electrical conductors. In another example, the telecommunications connector is used with a twisted pair system. Capacitances applied by the crosstalk compensation arrangement between electrical conductors associated with the pairs are provided such that, for each differential pair, a magnitude of an overall capacitance at a first electrical conductor of a differential pair is approximately equal to a magnitude of an overall capacitance at a second electrical conductor of the differential pair.

    Connector with capacitive crosstalk compensation to reduce alien crosstalk

    公开(公告)号:US10170861B2

    公开(公告)日:2019-01-01

    申请号:US15700484

    申请日:2017-09-11

    Abstract: The present disclosure relates to a telecommunications connector having cross-talk compensations, and a method of managing alien crosstalk in such a connector. In one example, the telecommunications connector includes electrical conductors arranged in differential pairs and a circuit board with conductive layers that provide a cross-talk compensation arrangement for applying capacitance between the electrical conductors. The circuit board includes conductive paths that provide capacitive coupling and a conductive plate that intensifies capacitive coupling of the electrical conductors. In another example, the telecommunications connector is used with a twisted pair system. Capacitances applied by the crosstalk compensation arrangement between electrical conductors associated with the pairs are provided such that, for each differential pair, a magnitude of an overall capacitance at a first electrical conductor of a differential pair is approximately equal to a magnitude of an overall capacitance at a second electrical conductor of the differential pair.

    Automated high frequency test station

    公开(公告)号:US10481194B2

    公开(公告)日:2019-11-19

    申请号:US15026693

    申请日:2014-10-02

    Abstract: A test station and method of testing a design under test are disclosed. One method includes applying a first test frequency signal to a reference path to determine a first known attenuation level, and applying the first test frequency signal to a design under test to determine a first tested attenuation level of the design under test at the first test frequency. The method also includes applying a second test frequency signal to the reference path to determine a second known attenuation level, and applying the second test frequency signal to the design under test to determine a second tested attenuation level of the design under test at the second test frequency. The method includes determining whether the design under test is faulty based on the first tested attenuation level and the second tested attenuation level.

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