中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

17 records (took 0.017 seconds)

    Methods and apparatuses for measuring the distance to a passive intermodulation source
    5.
    发明授权
    Methods and apparatuses for measuring the distance to a passive intermodulation source 有权

    公开(公告)号：US10897317B2

    公开(公告)日：2021-01-19

    申请号：US16682115

    申请日：2019-11-13

    Applicant: CommScope Technologies LLC

    Inventor： George P. Vella-Coleiro ,  XiaoHua Hou

    IPC: H04B17/00 ,  H04B3/46 ,  H04B17/30 ,  H04B17/15 ,  H04B17/29 ,  H04B17/16 ,  H04B17/10 ,  H04B17/17 ,  G01R23/20 ,  G01R31/08

    Abstract: According to methods of performing measurements to determine a distance to a passive-intermodulation (“PIM”) source, a first RF signal comprising a first frequency and a second RF signal comprising a second frequency may be applied to a device under test. A reference signal comprising a higher-order intermodulation-product of the first frequency and the second frequency may also be generated. An output signal from the device under test and the reference signal may be digitized and a calibration measurement may be applied. A phase difference between the device under test output and the reference signal may be determined. A plurality of phase differences may be determined for multiple first frequencies, and from the plurality of phase differences, a delay may be calculated, which may be multiplied by the velocity of propagation on the medium connecting the device under test to the test equipment to determine a distance to the PIM source.

    Alignment Determination for Antennas and Such
    7.
    发明申请
    Alignment Determination for Antennas and Such 审中-公开
    天线等的测定

    公开(公告)号：US20160020504A1

    公开(公告)日：2016-01-21

    申请号：US14418171

    申请日：2014-08-15

    Applicant: COMMSCOPE TECHNOLOGIES LLC

    Inventor： Scott L. Michaelis ,  Trevor M. Allen ,  George P. Vella-Coleiro

    IPC: H01Q1/12 ,  H01Q1/24

    CPC classification number: H01Q1/125 ,  H01Q1/246

    Abstract: An exemplary alignment module for a base station antenna has one or more accelerometers and one or more magnetometers. The one or more accelerometers are used to determine tilt and roll angles of the antenna, while the yaw angle of the antenna is determined using the one or more magnetometers and the determined tilt and roll angles. Using multiple accelerometers and/or multiple magnetometers can improve accuracy of angle determination. A service provider can determine when to re-align the antenna by monitoring the tilt, roll, and yaw angles remotely to detect changes in antenna orientation. Yaw angle determination can also take into account offset values corresponding to soft-iron effects, hard-iron effects, and factory calibration. The need to re-calibrate offset values following changes in local magnetic environment can be detected by comparing different sensor signals, such as the different magnetic fields detected by a plurality of magnetometers.

    Abstract translation: 用于基站天线的示例性对准模块具有一个或多个加速度计和一个或多个磁力计。 使用一个或多个加速度计来确定天线的倾斜角和倾斜角，同时使用一个或多个磁力计确定天线的偏转角和确定的倾斜和滚动角。 使用多个加速度计和/或多个磁力计可以提高角度确定的精度。 服务提供商可以通过远程监控倾斜，滚动和偏航角来确定何时重新对准天线，以检测天线方向的变化。 偏角确定也可以考虑对应于软铁效应，硬铁效应和工厂校准的偏移值。 可以通过比较不同的传感器信号（例如由多个磁力计检测到的不同的磁场）来检测在局部磁环境变化之后重新校准偏移值的需要。

    Methods and apparatuses for measuring the distance to a passive intermodulation source
    8.
    发明授权
    Methods and apparatuses for measuring the distance to a passive intermodulation source 有权

    公开(公告)号：US11387920B2

    公开(公告)日：2022-07-12

    申请号：US17121881

    申请日：2020-12-15

    Applicant: CommScope Technologies LLC

    Inventor： George P. Vella-Coleiro ,  XiaoHua Hou

    IPC: H04B17/00 ,  H04B3/46 ,  H04B17/30 ,  H04B17/15 ,  H04B17/29 ,  H04B17/16 ,  H04B17/10 ,  H04B17/17 ,  G01R23/20 ,  G01R31/08

    Abstract: According to methods of performing measurements to determine a distance to a passive-intermodulation (“PIM”) source, a first RF signal comprising a first frequency and a second RF signal comprising a second frequency may be applied to a device under test. A reference signal comprising a higher-order intermodulation-product of the first frequency and the second frequency may also be generated. An output signal from the device under test and the reference signal may be digitized and a calibration measurement may be applied. A phase difference between the device under test output and the reference signal may be determined. A plurality of phase differences may be determined for multiple first frequencies, and from the plurality of phase differences, a delay may be calculated, which may be multiplied by the velocity of propagation on the medium connecting the device under test to the test equipment to determine a distance to the PIM source.

    METHODS AND APPARATUSES FOR MEASURING THE DISTANCE TO A PASSIVE INTERMODULATION SOURCE
    10.
    发明申请
    METHODS AND APPARATUSES FOR MEASURING THE DISTANCE TO A PASSIVE INTERMODULATION SOURCE 有权

    公开(公告)号：US20210099239A1

    公开(公告)日：2021-04-01

    申请号：US17121881

    申请日：2020-12-15

    Applicant: CommScope Technologies LLC

    Inventor： George P. Vella-Coleiro ,  XiaoHua Hou

    IPC: H04B17/00 ,  H04B3/46 ,  H04B17/30 ,  H04B17/15 ,  H04B17/29 ,  H04B17/16 ,  H04B17/10 ,  H04B17/17 ,  G01R23/20

    Abstract: According to methods of performing measurements to determine a distance to a passive-intermodulation (“PIM”) source, a first RF signal comprising a first frequency and a second RF signal comprising a second frequency may be applied to a device under test. A reference signal comprising a higher-order intermodulation-product of the first frequency and the second frequency may also be generated. An output signal from the device under test and the reference signal may be digitized and a calibration measurement may be applied. A phase difference between the device under test output and the reference signal may be determined. A plurality of phase differences may be determined for multiple first frequencies, and from the plurality of phase differences, a delay may be calculated, which may be multiplied by the velocity of propagation on the medium connecting the device under test to the test equipment to determine a distance to the PIM source.

Patent Agency Ranking