Patent search ap:("COMP GENERALE ELECTRICITE") AND inv:"BIET JEAN-PIERRE" Page 1

1.

发明授权
Photo-diode and transistor semiconductor radiation detector with the photodiode biased slightly below its breakdown voltage 失效
Title translation: 光电二极管和晶体管半导体辐射检测器，其光电二极管偏压低于其断电电压

公开(公告)号：US3452206A

公开(公告)日：1969-06-24

申请号：US3452206D

申请日：1967-06-15

Applicant: COMP GENERALE ELECTRICITE

Inventor： BIET JEAN-PIERRE , BENOIT JACQUES L

IPC: H01L27/07 , H01L27/144 , H01L27/146 , H01L31/00 , H01J39/00 , H01J39/12

CPC classification number: H01L27/14643 , H01L27/0761 , H01L27/1446 , H01L31/00

2.

发明授权
Optical-electrical movement detector utilizing staggered rows of photodetectors and logic for determining the location of a luminous spot 失效
Title translation: 光电移动检测器利用光栅的划分方式和确定光斑位置的逻辑

公开(公告)号：US3697760A

公开(公告)日：1972-10-10

申请号：US3697760D

申请日：1971-08-17

Applicant: COMP GENERALE ELECTRICITE

Inventor： BIET JEAN-PIERRE , NGUYEN QUANG TAN , PERES GERARD , RIPOCHE GERARD

IPC: G01S3/784 , H04N5/335 , H04N5/369 , H01J39/12

CPC classification number: H04N5/335 , G01S3/784

Abstract: An optical-electrical detecting device comprising a series of staggered photo-sensitive diodes are appropriately connected to electronic circuits for providing a signal corresponding to the position of a relatively small luminous spot. The photo-diodes are arranged in two rows and are separated by baffle reflectors for providing a signal through logic gates to an integrated parity control circuit for defining the position of the luminous spot.

Abstract translation: 包括一系列交错光敏二极管的光电检测装置适当地连接到电子电路，以提供对应于相对较小发光点的位置的信号。光电二极管被布置成两排，并被挡板反射器隔开，用于通过逻辑门提供信号到集成奇偶校验控制电路，用于限定发光点的位置。

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