公开(公告)号：US07113567B2

公开(公告)日：2006-09-26

申请号：US10196805

申请日：2002-07-17

申请人： Carsten Michaelsen ,  Rüdiger Bormann ,  Jörg Wiesmann

发明人： Carsten Michaelsen ,  Rüdiger Bormann ,  Jörg Wiesmann

IPC分类号： G21K1/06 ,  G01N23/223 ,  G01T1/36

CPC分类号： G02B5/0891 ,  B82Y10/00 ,  G21K1/062 ,  G21K2201/061 ,  G21K2201/064

摘要： In an apparatus and a method for the analysis of atomic or molecular elements contained in a sample by wavelength dispersive X-ray spectrometry, wherein primary x ray or electron radiation is directed onto the sample whereby fluorescence radiation is emitted from the sample, the fluorescence radiation is directed onto a mirror or focussing device consisting of a multi-layer structure including pairs of layers of which one layer of a pair comprises carbon or scandium and the other comprises a metal oxide or a metal nitride and the fluorescence radiation is reflected from the mirror or focussing device onto an analysis detector for the analysis of the atomic or molecular elements contained in the sample.

摘要翻译： 在通过波长色散X射线光谱法分析样品中原子或分子元素的装置和方法中，其中初级x射线或电子辐射被引导到样品上，从而从样品发射荧光辐射，荧光辐射 被引导到由多层结构构成的反射镜或聚焦装置，该多层结构包括一对层，其中一层包括碳或钪，另一层包含金属氧化物或金属氮化物，并且荧光辐射从反射镜反射 或聚焦装置到分析检测器上，以分析样品中包含的原子或分子元素。

公开(公告)号：US06650728B2

公开(公告)日：2003-11-18

申请号：US10196806

申请日：2002-07-17

申请人： Carsten Michaelsen ,  Rudiger Bormann ,  Jörg Wiesmann

发明人： Carsten Michaelsen ,  Rudiger Bormann ,  Jörg Wiesmann

IPC分类号： G01N23223

CPC分类号： B82Y10/00 ,  G21K1/062 ,  G21K2201/061 ,  G21K2201/064

摘要： In an apparatus and a method for the analysis of atomic or molecular elements contained in a sample by wavelength dispersive X-ray spectrometry, wherein primary x ray or electron radiation is directed onto the sample whereby fluorescence radiation is emitted from the sample, the fluorescence radiation is directed onto a mirror or focussing device consisting of a multi-layer structure including pairs of layers of which one layer of a pair consists of lanthanum and the other consists of carbon and the fluorescence radiation is reflected from the mirror or focussing device onto an analysis detector for the analysis of the atomic or molecular elements contained in the sample.

摘要翻译： 在通过波长色散X射线光谱法分析样品中原子或分子元素的装置和方法中，其中初级x射线或电子辐射被引导到样品上，从而从样品发射荧光辐射，荧光辐射 被引导到由多层结构组成的反射镜或聚焦装置，该多层结构包括一对层，其中一层由镧构成，另一层由碳组成，另一层由碳组成，并且荧光辐射从反射镜或聚焦装置反射到分析 用于分析样品中包含的原子或分子元素的检测器。

公开(公告)号：US06258472B1

公开(公告)日：2001-07-10

申请号：US09335560

申请日：1999-06-18

申请人： Heinz-Werner Neumüller ,  Wolfgang Schmidt ,  Klaus Heinemann ,  Jörg Wiesmann ,  Jörg Hoffmann ,  Jürgen Dzick ,  Herbert-Carl Freyhardt

发明人： Heinz-Werner Neumüller ,  Wolfgang Schmidt ,  Klaus Heinemann ,  Jörg Wiesmann ,  Jörg Hoffmann ,  Jürgen Dzick ,  Herbert-Carl Freyhardt

IPC分类号： H01L3924

CPC分类号： H01L39/2461 ,  H01L39/16

摘要： The invention relates to a product having a substrate of a partially stabilized zirconium oxide and a buffer layer of a fully stabilized zirconium oxide. In this case, the substrate is untextured and the buffer layer is biaxially textured and joined to the substrate via an interlayer which consists is made of a material that is different than zirconium oxide but is compatible with the latter. This product is in particular produced with ion beam-assisted deposition of the buffer layer. It is suitable in particular as a support for a functional layer of a ceramic superconductor, e.g. for use as a superconducting current limiter.

摘要翻译： 本发明涉及具有部分稳定的氧化锆的基底和完全稳定的氧化锆的缓冲层的产品。 在这种情况下，衬底是非织构的，并且缓冲层是双轴织构的，并且通过中间层连接到衬底，所述中间层由不同于氧化锆的材料制成，但与后者相容。 该产品特别是用离子束辅助沉积缓冲层制成。 特别适用于陶瓷超导体的功能层的支持，例如， 用作超导限流器。