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1.
公开(公告)号:US20230282473A1
公开(公告)日:2023-09-07
申请号:US17999361
申请日:2021-05-19
发明人: Yuzo OKUMURA , Yuki FUKUI , Saori SHIOTA , Yoshiharu TERUI , Soichi KUMON
IPC分类号: H01L21/02 , C09D183/08 , C09D7/20
CPC分类号: H01L21/0206 , C09D183/08 , C09D7/20
摘要: A surface treatment method for a semiconductor substrate of the present invention is a treatment method of treating a main surface of a semiconductor substrate that has, on the main surface of the substrate, a pattern formation region in which a pattern having a concave-convex structure with a pattern dimension of 30 nm or less is formed and a pattern non-formation region in which no pattern is formed, the method including a surface treatment step of bringing a surface treatment agent composition including a silylating agent into contact with the pattern formation region and the pattern non-formation region on the main surface of the semiconductor substrate, in which, with respect to a surface of the pattern non-formation region after the surface treatment step, an IPA contact angle with 2-propanol is 2° or more at a room temperature of 25° C. and/or a water contact angle with pure water is 50° or more at the room temperature of 25° C.
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公开(公告)号:US20190074173A1
公开(公告)日:2019-03-07
申请号:US16084697
申请日:2017-03-07
发明人: Yuki FUKUI , Takashi SAIO , Atsushi RYOKAWA , Satoru NARIZUKA , Saori SHIOTA , Shota WATANABE , Shintaro SASAKI , Susumu IWASAKI
摘要: Disclosed are a water-repellent protective film forming agent for forming a water-repellent protective film on a silicon element-containing surface of a wafer and a water-repellent protective film forming liquid chemical in which the water-repellent protective film forming agent is dissolved in an organic solvent, characterized in that the water-repellent protective film forming agent consists of at least one kind of silicon compound selected from the group consisting of a sulfonimide derivative represented by the following general formula [1], a sulfonimide derivative represented by the following general formula [2] and a sulfonmethide derivative represented by the following general formula [3].
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3.
公开(公告)号:US20230282474A1
公开(公告)日:2023-09-07
申请号:US17999363
申请日:2021-05-19
发明人: Yuzo OKUMURA , Yuki FUKUI , Saori SHIOTA , Yoshiharu TERUI , Soichi KUMON
IPC分类号: H01L21/02
CPC分类号: H01L21/0206
摘要: A surface treatment method for semiconductor substrates of the present invention is a treatment method of treating a main surface of a semiconductor substrate that has, on the main surface of the substrate, a pattern formation region in which a pattern having a concave-convex structure with a pattern dimension of 30 nm or less is formed and a bevel region which is formed on a periphery of the pattern formation region, the method including a surface treatment step of bringing a surface treatment agent composition including a silylating agent into contact with the pattern formation region and the bevel region on the main surface of the semiconductor substrate, in which, with respect to a surface of a silicon oxide substrate brought into contact with the surface treatment agent composition, an IPA receding contact angle is 3° or more at a room temperature of 25° C., and/or a water receding contact angle is 40° or more at the room temperature of 25° C.
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4.
公开(公告)号:US20200350176A1
公开(公告)日:2020-11-05
申请号:US16957331
申请日:2018-12-26
发明人: Yuki FUKUI , Yoshiharu TERUI , Shuhei YAMADA , Yuzo OKUMURA , Soichi KUMON , Saori SHIOTA , Katsuya KONDO
IPC分类号: H01L21/306 , H01L21/02 , C07F7/10
摘要: According to the present disclosure, there is provided a water-repellent protective film-forming liquid chemical capable of achieving an improved water repellency imparting effect. The water-repellent protective film-forming liquid chemical according to the present disclosure contains the following compositions: (I) an aminosilane composition of the following general formula [1]; (II) a silicon compound of the following general formula [2]; and (III) an aprotic solvent, wherein the amount of the component (I) contained is 0.02 to 0.5 mass % based on the total amount of the components (I) to (III). (R1)aSi(H)b(NH2)4-a-b [1] (R2)cSi(H)dX4-c-d [2]
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