Abstract:
A memory includes a memory cell coupled to a data line. A sense amplifier is coupled to the data line. A power supply node has a first voltage. The first voltage is provided to the sense amplifier. A charge pump circuit is coupled to the sense amplifier. The charge pump circuit is configured to provide a second voltage to the sense amplifier when a read operation is performed.
Abstract:
A method includes receiving instructions for designing a ROM array, generating netlists for the ROM array, generating a data file representing a physical layout of the ROM array on a semiconductor wafer, and storing the data file in a computer readable storage medium. The instructions for the ROM array define a layout for a first unit including a first bit cell coupled to a first word line, a bus that may be coupled and uncoupled to a first power supply having a first voltage level, a layout for a second unit coupled to a second word line, and a layout for a third unit having an isolation device and being configured to share a bit line contact with the second unit or another third unit. The layout for the second unit is configured to be arranged at an edge of the ROM array and includes a dummy device.
Abstract:
A memory circuit is provided. The memory circuit includes a memory array having a bit line (BL), and a memory cell coupled to the BL; a sense amplifier (SA) coupled to the BL; a tracking bit line (TRKBL); and a comparator coupled to the TRKBL and configured to receive a reference voltage, and to output a strobe signal to the SA.
Abstract:
The present application discloses a method of preparing a layout for manufacturing an integrated circuit chip according to a circuit design. In at least one embodiment, a pattern for the layout based on the circuit design is generated. After the generation of the pattern, it is determined if at least one layout rule is violated in the layout, the at least one layout rule being specified according to a predetermined maximum value for at least one of an estimated voltage drop along a signal path in the layout or an estimated current density on the signal path. If the at least one layout rule is violated, a violation is indicated.