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公开(公告)号:US20070080452A1
公开(公告)日:2007-04-12
申请号:US11514329
申请日:2006-09-01
申请人: Chen-Ya- Chi , Chun-Ying Lin , An-Hong Liu , Yi-Chang Lee , Hsiang-Ming Huang
发明人: Chen-Ya- Chi , Chun-Ying Lin , An-Hong Liu , Yi-Chang Lee , Hsiang-Ming Huang
CPC分类号: H01L24/10 , H01L24/13 , H01L2224/05571 , H01L2224/05573 , H01L2224/13 , H01L2224/13099 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01029 , H01L2924/01033 , H01L2924/01078 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/351 , H05K3/4007 , H05K3/4015 , H05K2201/0347 , H05K2201/0367 , H05K2201/10977 , H05K2203/049 , H05K2203/0597 , H01L2924/00 , H01L2224/05599
摘要: A bump structure mainly includes a metal core, a buffer encapsulant, and a metal cap where the metal core is a stud bump formed by wire bonding. The buffer encapsulant encapsulates the metal core. A metal cap is formed on the top surface of the buffer encapsulant and is electrically connected to the metal core. Therefore, the bump structure possesses excellent resistance of thermal stress to reduce or even eliminate metal fatigue in the bump without causing electrical shorts in the package.
摘要翻译: 凸块结构主要包括金属芯,缓冲密封剂和金属盖,其中金属芯是通过引线键合形成的柱形凸块。 缓冲密封剂封装金属芯。 金属盖形成在缓冲密封剂的顶表面上并与金属芯电连接。 因此,凸块结构具有优异的热应力阻力,以减少或甚至消除凸块中的金属疲劳,而不会导致封装中的电短路。