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公开(公告)号：US20230221113A1
公开(公告)日：2023-07-13
申请号：US18093352
申请日：2023-01-05
申请人： CiTEX Holding GmbH
发明人： Andrej UNRUH
CPC分类号： G01B21/08 , G01B11/0691 , G01B5/068 , G01B17/02
摘要： The present disclosure relates to a method for calibrating a stationary THz measuring device which measures geometric properties of a profile by means of one or more THz sensors during an extrusion of the profile, comprising at least one or more steps.
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公开(公告)号：US20230339164A1
公开(公告)日：2023-10-26
申请号：US18303187
申请日：2023-04-19
申请人： CiTEX Holding GmbH
发明人： Andrej UNRUH , Jan H. PETERMANN
CPC分类号： B29C48/92 , B29C48/022 , B29C2948/92152 , B29C2948/92247 , B29C2948/92447 , B29C2948/92723 , B29C2948/92828 , B29K2507/04
摘要： The present disclosure relates to a method and an extrusion line in which an additive content, in particular, a carbon black content, can be determined inline during extrusion of an extrusion product. For this purpose, an initial measurement is carried out in which a layer thickness and a refractive index of the extrusion product are determined, whereupon a continuous in-line measurement of the current additive content is carried out by a stationary radar measuring device. Thus, the layer thickness is set and the additive content is determined directly by the radar measuring device and controlled by setting the additive feed rate, in particular as a close-loop control.
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