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公开(公告)号:US20240353355A1
公开(公告)日:2024-10-24
申请号:US18532137
申请日:2023-12-07
Applicant: CiTEX Holding GmbH
Inventor: Arno NEUMEISTER , Christoph HERRMANN
IPC: G01N23/18 , G01N23/083
CPC classification number: G01N23/18 , G01N23/083 , G01N2223/1016 , G01N2223/32 , G01N2223/401 , G01N2223/413 , G01N2223/426 , G01N2223/628 , G01N2223/6466
Abstract: The present disclosure relates to an X-ray measuring method and an X-ray measuring device for measuring a strand.
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公开(公告)号:US20230339164A1
公开(公告)日:2023-10-26
申请号:US18303187
申请日:2023-04-19
Applicant: CiTEX Holding GmbH
Inventor: Andrej UNRUH , Jan H. PETERMANN
CPC classification number: B29C48/92 , B29C48/022 , B29C2948/92152 , B29C2948/92247 , B29C2948/92447 , B29C2948/92723 , B29C2948/92828 , B29K2507/04
Abstract: The present disclosure relates to a method and an extrusion line in which an additive content, in particular, a carbon black content, can be determined inline during extrusion of an extrusion product. For this purpose, an initial measurement is carried out in which a layer thickness and a refractive index of the extrusion product are determined, whereupon a continuous in-line measurement of the current additive content is carried out by a stationary radar measuring device. Thus, the layer thickness is set and the additive content is determined directly by the radar measuring device and controlled by setting the additive feed rate, in particular as a close-loop control.
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公开(公告)号:US20230093966A1
公开(公告)日:2023-03-30
申请号:US17953577
申请日:2022-09-27
Applicant: CiTEX Holding GmbH
Inventor: Ralph KLOSE , Arno NEUMEISTER
IPC: G01N21/3581 , G01B11/06 , G01N21/3563
Abstract: The present disclosure relates to a THz measuring device for measuring a measuring object and a THz measuring method for measuring a measuring object.
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公开(公告)号:US20250035437A1
公开(公告)日:2025-01-30
申请号:US18782387
申请日:2024-07-24
Applicant: CiTEX Holding GmbH
Inventor: Jan Hendrik BECKMANN , Markus HILDEBRANDT
Abstract: A THz measuring method and a THz device for measuring a container with a joint, in particular, a blow mold container with a pinch-off seam, where a THZ sensor is adjusted relative to a container region in multiple positions with different orientations of the optical axis, THz radiation is emitted as a non-parallel beam bundle from the THz sensor towards the container region, and THz radiation partially reflected on the interior surface and the exterior surface of the container area is received, and one or more of the characteristics of the joint are determined.
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公开(公告)号:US20230321893A1
公开(公告)日:2023-10-12
申请号:US18299094
申请日:2023-04-12
Applicant: CiTEX Holding GmbH
Inventor: Jan Hendrik PETERMANN
CPC classification number: B29C49/78 , B29C49/0411 , B29C2049/78715 , B29C2049/7875 , B29C2049/78755
Abstract: The present disclosure relates to a measuring arrangement and a method for measuring a molten tube of an extrusion blow-molding process, including at least the following process steps: positioning or providing a THz measuring device including a THz sensor comprising an optical axis, extruding a molten tube by a blow-molding extruder along an extrusion axis, emitting a THz transmission beam from the THz sensor along its optical axis in such a manner that the front wall of the molten tube lies in a divergent beam area of the THz transmission beam behind the focus or in a convergent beam area before the focus, receiving a reflected beam reflected from the molten tube and evaluating a measuring signal in the reflected beam.
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公开(公告)号:US20230221113A1
公开(公告)日:2023-07-13
申请号:US18093352
申请日:2023-01-05
Applicant: CiTEX Holding GmbH
Inventor: Andrej UNRUH
CPC classification number: G01B21/08 , G01B11/0691 , G01B5/068 , G01B17/02
Abstract: The present disclosure relates to a method for calibrating a stationary THz measuring device which measures geometric properties of a profile by means of one or more THz sensors during an extrusion of the profile, comprising at least one or more steps.
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公开(公告)号:US11673751B2
公开(公告)日:2023-06-13
申请号:US17375416
申请日:2021-07-14
Applicant: CiTEX Holding GmbH
Inventor: Roland Böhm
CPC classification number: B65G65/44 , B65G2201/04
Abstract: The present disclosure relates to a method for vibration feeding of bulk material and a vibration feeder device provided for such purposes, comprising a material feed, a charging hopper including a hopper discharge, a feeder tray, a height adjustment means for adjusting a level height between the hopper discharge and the feeder tray, and a vibration driver for driving the feeder tray at an oscillation amplitude and an oscillation frequency, where a target material throughput and material specific parameters of the bulk material are input, initial parameters for the level height, oscillation amplitude and oscillation frequency are determined from these inputs, and subsequently the level height is adjusted by controlling the height adjustment means.
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公开(公告)号:US12216050B2
公开(公告)日:2025-02-04
申请号:US17602578
申请日:2020-04-09
Applicant: CiTEX Holding GmbH
Inventor: Roland Böhm
Abstract: The invention relates to a method for calibrating a THz measuring apparatus (8), in particular a pipe, on a measurement object (10), comprising at least the following steps: providing a THz measuring apparatus (8) having a plurality of pivotable THz sensors (1), arranged in a circumferential direction around a measuring chamber (9), for outputting one THz transmitted beam (12) each along a sensor axis (B) (provision step); orienting the THz sensors (1) into a starting position in the measuring chamber (9) in which the measurement object (10) is received (orientation step in starting position); allocating the THz sensors (1) to at least one first and one second sensor group (group formation step); first calibration adjustment step, in which the second sensor group is adjusted as an adjustment group by means of the first sensor group as a starting group, and corresponding second calibration adjustment step, in which the first sensor group is adjusted as an adjustment group by means of the previously calibration-adjusted second sensor group as a starting group; wherein, in each of the calibration adjustment steps=by means of the THz sensors (S1, S3, S5, S7) of the starting group, spacing points on a surface (10a) of the measurement object (10) are determined, =sensor correction angles of the THz sensors (1; S2, S4, S6, S8) of the adjustment group are determined by means of the spacing points determined by the starting group, and =the THz sensors of the adjustment group are calibration-adjusted about the determined sensor correction angles (a).
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公开(公告)号:US20240328777A1
公开(公告)日:2024-10-03
申请号:US18620057
申请日:2024-03-28
Applicant: CiTEX Holding GmbH
Inventor: Ralph KLOSE
IPC: G01B11/06
CPC classification number: G01B11/06
Abstract: The present disclosure relates to a THz measuring method and a THz measuring device for measuring a profile, in particular, of an extruded pipe in a measuring space
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公开(公告)号:US20240003676A1
公开(公告)日:2024-01-04
申请号:US18039072
申请日:2021-12-02
Applicant: CiTEX Holding GmbH
Inventor: David WINKING , Juliane EGGERT , Roland BÖHM
IPC: G01B11/06 , G01B9/02017
CPC classification number: G01B11/06 , G01B9/02017
Abstract: The invention relates to a THz sensor (2) for measuring an object to be measured (6), in particular, a pipe, the THz sensor (2) comprising:
a THz transceiver (10) for emitting and receiving THz radiation,
a lens (14) for bundling the THz radiation emitted by the THz transceiver (10) and emitting a THz transmission beam (8) along the optical axis (A) and for receiving a THz reflection beam (15),
a support device (11), on which the lens (14) and/or the THz transceiver (10) is accommodated or fastened.
Hereby, it is provided that
a THz radiation-influencing compensation formation for modifying and/or reducing incident THz radiation is provided in a compensation area between the lens and the support device (11).
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