摘要:
An ESD-robust I/O driver circuit is disclosed. Embodiments include providing a first NMOS transistor having a first source, a first drain, and a first gate; coupling the first source to a ground rail and the first drain to an I/O pad; coupling a gate driver control circuit to the first drain and the first gate; and providing a ground potential to the first gate, via the gate driver control circuit, during an ESD event occurring from the I/O pad to the ground rail.
摘要:
A ESD protection scheme is disclosed for circuits with multiple power domains. Embodiments include: coupling a first power clamp to a first power rail and a first ground rail of a first domain; coupling a second power clamp to a second power rail and a second ground rail of a second domain; providing a blocking circuit for blocking current from an ESD event; providing an I/O interface connection in the first domain for transmitting signals from the first domain to the blocking circuit; providing a core interface connection in the second domain for transmitting signals from the blocking circuit to the second domain; coupling an input connection of the blocking circuit to the I/O interface connection; and coupling an output connection of the blocking circuit to a core interface connection.
摘要:
An ESD-robust I/O driver circuit is disclosed. Embodiments include providing a first NMOS transistor having a first source, a first drain, and a first gate; coupling the first source is coupled to a ground rail, and the first drain to an I/O pad; providing a gate driver control circuit including a second NMOS transistor having a second source, a second drain, and a second gate; and coupling the second drain to the first gate, the second source to the ground rail, wherein the gate driver control circuit provides a ground potential to the first gate during an ESD event occurring from the I/O pad to the ground rail.
摘要:
A ESD protection scheme is disclosed for circuits with multiple power domains. Embodiments include: coupling a first power clamp to a first power rail and a first ground rail of a first domain; coupling a second power clamp to a second power rail and a second ground rail of a second domain; providing a blocking circuit for blocking current from an ESD event; providing an I/O interface connection in the first domain for transmitting signals from the first domain to the blocking circuit; providing a core interface connection in the second domain for transmitting signals from the blocking circuit to the second domain; coupling an input connection of the blocking circuit to the I/O interface connection; and coupling an output connection of the blocking circuit to a core interface connection.
摘要:
An RC-based electrostatic discharge protection device provides an extended snapback trigger voltage range, thereby avoiding latch-up. Two parallel current discharge paths are provided between supply terminals during an electrostatic discharge event by virtue of an added external resistor. The first current discharge path includes body resistance of the protection device and the second current discharge path includes the external resistor.
摘要:
A triple stack NMOS integrated circuit structure protection circuit for a plurality of terminals operative at respective voltage levels is coupled between the plurality of terminals. First and second NMOS elements of the triple stack NMOS share a common active region. A third NMOS element, vertically positioned with respect to the first and second NMOS elements, has an active region separate from the active region of the first and second NMOS elements. The first, second and third NMOS elements are connected in series between two terminals of the plurality of terminals.
摘要:
A cross-domain ESD protection scheme is disclosed. Embodiments include coupling a first power clamp to a first power rail and a first ground rail; providing a first NMOS transistor having a first source, a first drain, and a first gate; coupling the first source to a second ground rail; providing a first PMOS transistor having a second source, a second drain, and a second gate; coupling the second source to the first power rail; and providing, via the first power clamp, a signal to turn on the first NMOS transistor during an ESD event that occurs at the first power rail.
摘要:
An ESD-robust I/O driver circuit is disclosed. Embodiments include providing a first NMOS transistor having a first source, a first drain, and a first gate; coupling the first source is coupled to a ground rail, and the first drain to an I/O pad; providing a gate driver control circuit including a second NMOS transistor having a second source, a second drain, and a second gate; and coupling the second drain to the first gate, the second source to the ground rail, wherein the gate driver control circuit provides a ground potential to the first gate during an ESD event occurring from the I/O pad to the ground rail.
摘要:
An ESD protection device with a tunable holding voltage is disclosed. Embodiments include: providing a silicon-controlled rectifier (SCR) having a first n-type layer with a cathode connection, a first p-type layer with a first control connection, a second n-type layer with a second control connection, and a second p-type layer with an anode connection; coupling the anode connection to a power rail; coupling the cathode connection to a ground rail; providing a tunable holding voltage control unit including a first NMOS having a first gate, a first drain, and a first source, wherein during an ESD event, the first NMOS is turned off and a holding voltage of the SCR is low; coupling the first drain to the first control connection; coupling the first source to the ground rail; and coupling the first gate to a program circuit.
摘要:
An ESD protection device with a tunable holding voltage is disclosed. Embodiments include: providing a silicon-controlled rectifier (SCR) having a first n-type layer with a cathode connection, a first p-type layer with a first control connection, a second n-type layer with a second control connection, and a second p-type layer with an anode connection; coupling the anode connection to a power rail; coupling the cathode connection to a ground rail; providing a tunable holding voltage control unit including a first NMOS having a first gate, a first drain, and a first source, wherein during an ESD event, the first NMOS is turned off and a holding voltage of the SCR is low; coupling the first drain to the first control connection; coupling the first source to the ground rail; and coupling the first gate to a program circuit.