摘要:
According to an aspect of the present invention, there is provided a ferroelectric memory device including: a cell unit including: a first select transistor having a first source, a first drain, and a first gate, one of the first source and the first drain being connected to a bit line; and a memory cell unit having a plurality of first memory cells, each of the first memory cells including a first ferroelectric capacitor and a first memory transistor; and a ferroelectric memory fuse including: a second select transistor having a second source, a second drain, and a second gate connected to a second select line, one of the second source and the second drain being connected to one end of the bit line; and a memory fuse unit having a plurality of second memory cells, each of the second memory cells including a second ferroelectric capacitor and a second memory transistor.
摘要:
A ferroelectric memory according to an embodiment of the present invention includes a memory cell array including plural memory cells, and provided with plural word lines, plural bit lines, and plural plate lines, each of the plate lines corresponding to at least two of the word lines, an access control circuit configured to perform an access operation to a selected cell which is selected from the memory cells, and a refresh control circuit configured to perform a refresh operation, in a background of the access operation, on a refresh cell which is selected from the memory cells, the refresh control circuit performing the refresh operation when a plate line connected to the selected cell and a bit line connected to the selected cell are at the same potential after the access operation.
摘要:
A power supply circuit has a constant voltage circuit, a first MOS transistor, a second MOS transistor, a third MOS transistor, a first voltage dividing circuit that outputs a first divided voltage obtained by dividing the voltage of the output terminal by a first voltage dividing ratio, and a first differential amplifier circuit which is fed with a reference voltage and the first divided voltage and has an output connected to a gate of the second MOS transistor. The first differential amplifier circuit outputs a signal to turn on the second MOS transistor when the first divided voltage is higher than the reference voltage, and the first differential amplifier circuit outputs a signal to turn off the second MOS transistor when the first divided voltage is lower than the reference voltage.
摘要:
A first ferroelectric memory cell and a second ferroelectric memory cell each include a ferroelectric capacitor and a transistor and each store one set of information. A word-line is shared by the first and second ferroelectric memory cells. A first plate line is connected to the first ferroelectric memory cell and a second plate line is connected to the second ferroelectric memory cell. A selection transistor has one end connected to the first and second ferroelectric memory cells and the other end connected to a bit-line.
摘要:
A plurality of ferroelectric memory cells is arrayed. One terminal of each memory cells arrayed in the same column is connected in common to a first bit line. A gate of a transistor of memory cells arrayed in the same row is connected in common to a word line. The other terminal of each of memory cells arrayed in the same column or the same row is connected in common to a cell plate line. A second bit line is connected with a reference voltage supply circuit. The first and second bit lines are connected with a data read circuit. The data read circuit includes a sense amplifier and a current mirror circuit having a pair of current input node connected to the first and second bit lines, and carrying the same current flowing through one of the first and second bit line to the other bit line.
摘要:
A ferroelectric memory device includes a cell block, a bit line, and a plate line. The cell block includes a ferroelectric capacitor and a transistor switch. The bit line applies a voltage to one electrode of the ferroelectric capacitor. The plate line applies a voltage to the other electrode of the ferroelectric capacitor. In a read operation of data, a first voltage is applied to the plate line. In a write operation of data, a second voltage different from the first voltage is applied to the plate line, and a voltage which is higher or lower than the second voltage is applied to the bit line.
摘要:
A reference voltage generation circuit includes a first node settable at a reference voltage to be any one of a plurality of voltage levels, a second node set at a pre-charge voltage, first and second switches connected in series between the first and second nodes, a plurality of capacitors, each capacitor comprising a first end connected to a connection node between the first and second switches and a second end settable at an independent voltage level, a switch controller configured to turn off the first switch and turn on the second switch in an initial state, and then to turn off the second switch, and then to turn on the first switch, and a voltage controller configured to individually set a voltage at the second end of each capacitor after the first switch is turned on.
摘要:
A memory includes ferroelectric capacitors; sense amplifiers configured to detect the data stored in ferroelectric capacitors; and a plate control circuit configured to receive a plate driving signal driving a plate line, a write signal indicating writing of data from an outside to the sense amplifier, and an operation end signal indicating end of an executable period for reading or writing data between the sense amplifier and the outside, the plate control circuit validating or invalidating the plate driving signal based on the write signal and the operation end signal wherein the plate control circuit validates the plate driving signal in the executable period, and the plate control circuit invalidates the plate driving signal at the end of the executable period when the write signal is never activated in the executable period, and keeps the plate driving signal valid when the write signal is activated in the executable period.
摘要:
A reference bit line which supplies a reference potential to a sense amplifier circuit is connected to the sense amplifier circuit. A reference potential generating circuit is connected to the reference bit line. The reference potential generating circuit includes a selection transistor which is connected at one end to the reference bit line, and a paraelectric capacitor connected between the other end of the selection transistor and a dummy plate line. A dummy plate line driver is connected to the dummy plate line. The dummy plate line driver drives the dummy plate line to a first voltage which is higher than an operating voltage of the sense amplifier circuit, when the reference potential generating circuit generates the reference potential.
摘要:
This disclosure concerns a semiconductor memory device including a ferroelectric capacitor; a cell transistor having a source connected to a first electrode of the ferroelectric capacitor; bit lines; word lines; n plate lines corresponding to n column blocks and connected to a second electrodes of the ferroelectric capacitors in the corresponding column blocks, respectively, the n column blocks being obtained by dividing the cell array into the n column blocks for every set of m columns, where n≧2 and m≧2; a plurality of reset transistors connected between the bit lines and the n plate lines; and m reset lines corresponding to the m columns within the column blocks and connected to gates of n reset transistors of the reset transistors, the n reset transistors being respectively provided in n columns respectively included in the n column blocks.