Optical microscope stage for scanning probe microscope
    1.
    发明授权
    Optical microscope stage for scanning probe microscope 失效
    扫描探针显微镜的光学显微镜镜

    公开(公告)号:US06310342B1

    公开(公告)日:2001-10-30

    申请号:US09128885

    申请日:1998-08-04

    IPC分类号: H01J3720

    摘要: Scanning probe microscopes and scanning probe heads are provided having improved optical visualization and sample manipulation capabilities. The SPMs and SPM heads include at least one flexure stage for scanning in the x, y and/or z directions. In a preferred embodiment, the SPMs or SPM heads include flexure stages for scanning in the x, y and z directions. The z scanning stage is preferably positioned outside the lateral footprint of the x-y flexure stage so that a probe extending from the z scanning stage is outside the lateral footprint of the instrument. The SPMs and SPM heads are configured to provide top down and bottom up optical views of the sample and/or the probe and enable simultaneous scanning probe microscopy and optical imaging of a sample to be performed. The SPMs and SPM heads are designed to be readily combinable with existing upright and inverted optical microscopes currently available from various major manufacturers.

    摘要翻译: 提供扫描探针显微镜和扫描探头,具有改进的光学可视化和样品操作能力。 SPM和SPM头包括用于在x,y和/或z方向扫描的至少一个弯曲台。 在优选实施例中,SPM或SPM头包括用于在x,y和z方向扫描的挠曲台。 z扫描台优选地定位在x-y弯曲台的横向覆盖区的外侧,使得从z扫描台延伸的探针位于仪器的横向覆盖区之外。 SPM和SPM头被配置为提供样品和/或探针的自顶向下和从底部的光学视图,并且能够执行样品的同时扫描探针显微镜和光学成像。 SPM和SPM头设计为可以与现有的各种主要制造商现有的直立和倒置光学显微镜组合。

    Slider fly-height measurement using viscoelastic material
    2.
    发明申请
    Slider fly-height measurement using viscoelastic material 失效
    使用粘弹性材料的滑块飞行高度测量

    公开(公告)号:US20050068660A1

    公开(公告)日:2005-03-31

    申请号:US10676734

    申请日:2003-09-30

    摘要: A method is presented for measuring the height of an air-bearing separating a flying component from a rotating surface using physical deformation of a small amount of material deposited on the surface. One embodiment of the invention is a method of measuring the fly-height of a slider using physical deformation of material deposited on the disk. Small amounts of the deformable material such as a viscoelastic lubricant are placed on a limited area of the disk so that the slider can otherwise fly normally. The slider's fly-height is established over the unaltered portion of the disk, then the slider impacts the deformable material. This process results in the deformable material being flattened or removed above the fly-height of the slider. The height of the remaining material is then measurable as the fly-height.

    摘要翻译: 提出了一种用于通过沉积在表面上的少量材料的物理变形来测量使飞行部件与旋转表面分离的空气轴承的高度的方法。 本发明的一个实施例是使用沉积在盘上的材料的物理变形来测量滑块的飞行高度的方法。 少量的可变形材料例如粘弹性润滑剂被放置在盘的有限区域上,使得滑块可否以正常方式飞行。 滑块的飞行高度建立在盘的未改变的部分上,然后滑块冲击可变形材料。 该过程导致可变形材料在滑块的飞行高度之上被平坦化或去除。 然后剩余材料的高度可以作为飞行高度被测量。

    Kinematically mounted probe holder for scanning probe microscope
    3.
    发明授权
    Kinematically mounted probe holder for scanning probe microscope 有权
    用于扫描探针显微镜的运动学安装的探头支架

    公开(公告)号:US6057546A

    公开(公告)日:2000-05-02

    申请号:US129066

    申请日:1998-08-04

    摘要: Scanning probe microscopes and scanning probe heads are provided having improved optical visualization and sample manipulation capabilities. The SPMs and SPM heads include at least one flexure stage for scanning in the x, y and/or z directions. In a preferred embodiment, the SPMs or SPM heads include flexure stages for scanning in the x, y and z directions. The z scanning stage is preferably positioned outside the lateral footprint of the x-y flexure stage so that a probe extending from the z scanning stage is outside the lateral footprint of the instrument. The SPMs and SPM heads are configured to provide top down and bottom up optical views of the sample and/or the probe and enable simultaneous scanning probe microscopy and optical imaging of a sample to be performed. The SPMs and SPM heads are designed to be readily combinable with existing upright and inverted optical microscopes currently available from various major manufacturers.

    摘要翻译: 提供扫描探针显微镜和扫描探头,具有改进的光学可视化和样品操作能力。 SPM和SPM头包括用于在x,y和/或z方向扫描的至少一个弯曲台。 在优选实施例中,SPM或SPM头包括用于在x,y和z方向扫描的挠曲台。 z扫描台优选地定位在x-y弯曲台的横向覆盖区的外侧,使得从z扫描台延伸的探针位于仪器的横向覆盖区之外。 SPM和SPM头被配置为提供样品和/或探针的自顶向下和从底部的光学视图,并且能够执行样品的同时扫描探针显微镜和光学成像。 SPM和SPM头设计为可以与现有的各种主要制造商现有的直立和倒置光学显微镜组合。

    Soft underlayer for perpendicular media with mechanical stability and corrosion resistance
    4.
    发明申请
    Soft underlayer for perpendicular media with mechanical stability and corrosion resistance 审中-公开
    用于垂直介质的软底层具有机械稳定性和耐腐蚀性

    公开(公告)号:US20080090106A1

    公开(公告)日:2008-04-17

    申请号:US11580648

    申请日:2006-10-13

    IPC分类号: G11B5/66

    CPC分类号: G11B5/667

    摘要: A perpendicular magnetic recording disk has a granular cobalt alloy recording layer (RL) containing on the “soft” magnetic underlayer (SUL). The SUL is doped with judiciously chosen elements or alloys or is capped or intercalated with said elements or metal alloy layers. The resulting disk and the SUL in particular has good recording properties, improved mechanical strength and improved corrosion resistance over a comparable disk without the doping or thin layers.

    摘要翻译: 垂直磁记录盘具有包含在“软”磁性底层(SUL)上的颗粒状钴合金记录层(RL)。 SUL掺杂有明智选择的元素或合金,或者被封盖或嵌入所述元件或金属合金层。 所得到的盘和SUL特别具有良好的记录性能,改善的机械强度和在不具有掺杂或薄层的相当的盘上提高的耐腐蚀性。

    Scanning probe microscope providing unobstructed top down and bottom up
views
    5.
    发明授权
    Scanning probe microscope providing unobstructed top down and bottom up views 失效
    扫描探针显微镜提供畅通无阻的自顶向下和向下观察

    公开(公告)号:US5854487A

    公开(公告)日:1998-12-29

    申请号:US808351

    申请日:1997-02-28

    摘要: Scanning probe microscopes and scanning probe heads are provided having improved optical visualization and sample manipulation capabilities. The SPMs and SPM heads include at least one flexure stage for scanning in the x, y and/or z directions. In a preferred embodiment, the SPMs or SPM heads include flexure stages for scanning in the x, y and z directions. The z scanning stage is preferably positioned outside the lateral footprint of the x-y flexure stage so that a probe extending from the z scanning stage is outside the lateral footprint of the instrument. The SPMs and SPM heads are configured to provide top down and bottom up optical views of the sample and/or the probe and enable simultaneous scanning probe microscopy and optical imaging of a sample to be performed. The SPMs and SPM heads are designed to be readily combinable with existing upright and inverted optical microscopes currently available from various major manufacturers.

    摘要翻译: 提供扫描探针显微镜和扫描探头,具有改进的光学可视化和样品操作能力。 SPM和SPM头包括用于在x,y和/或z方向扫描的至少一个弯曲台。 在优选实施例中,SPM或SPM头包括用于在x,y和z方向扫描的挠曲台。 z扫描台优选地定位在x-y弯曲台的横向覆盖区的外侧,使得从z扫描台延伸的探针位于仪器的横向覆盖区之外。 SPM和SPM头被配置为提供样品和/或探针的自顶向下和从底部的光学视图,并且能够执行样品的同时扫描探针显微镜和光学成像。 SPM和SPM头设计为可以与现有的各种主要制造商现有的直立和倒置光学显微镜组合。

    Method and apparatus for calibrating X-ray detectors in a CT-imaging system
    6.
    发明授权
    Method and apparatus for calibrating X-ray detectors in a CT-imaging system 失效
    用于校准CT成像系统中的X射线检测器的方法和装置

    公开(公告)号:US07476026B2

    公开(公告)日:2009-01-13

    申请号:US10491175

    申请日:2001-10-01

    申请人: David Braunstein

    发明人: David Braunstein

    IPC分类号: G01D18/00

    CPC分类号: A61B6/032 A61B6/585

    摘要: A method of adjusting values for sensitivities of X-ray detectors comprised in a CT-imager that generate signals responsive to X-rays from an X-ray source in the imager, comprising: acquiring signals generated by X-ray detectors in the CT-imager responsive to X-rays incident thereon from the X-ray source for views taken during a scanning procedure performed by the CT-imager to image a patient when only air is present in a space between the X-ray source and the detectors; and using the signals to adjust the values of the sensitivities.

    摘要翻译: 一种调整CT成像器中包含的X射线检测器的灵敏度值的方法,该CT成像器产生响应来自成像器中的X射线源的X射线的信号,包括:获取由CT扫描仪中的X射线检测器产生的信号, 成像器响应于从X射线源入射到其上的X射线,用于在CT成像仪执行的扫描过程期间拍摄的图像,以在仅在X射线源和检测器之间的空间中存在空气时对患者进行成像; 并使用信号调整灵敏度的值。

    Slider fly-height measurement using viscoelastic material

    公开(公告)号:US06920008B2

    公开(公告)日:2005-07-19

    申请号:US10676734

    申请日:2003-09-30

    IPC分类号: G11B5/00 G11B5/60 G11B27/36

    摘要: A method is presented for measuring the height of an air-bearing separating a flying component from a rotating surface using physical deformation of a small amount of material deposited on the surface. One embodiment of the invention is a method of measuring the fly-height of a slider using physical deformation of material deposited on the disk. Small amounts of the deformable material such as a viscoelastic lubricant are placed on a limited area of the disk so that the slider can otherwise fly normally. The slider's fly-height is established over the unaltered portion of the disk, then the slider impacts the deformable material. This process results in the deformable material being flattened or removed above the fly-height of the slider. The height of the remaining material is then measurable as the fly-height.