公开(公告)号：US08415787B2

公开(公告)日：2013-04-09

申请号：US13476417

申请日：2012-05-21

申请人： Mohammad Shafiqul Kabir

发明人： Mohammad Shafiqul Kabir

IPC分类号： H01L23/34

CPC分类号： B01J23/755 ,  B01J23/76 ,  B82Y10/00 ,  B82Y30/00 ,  B82Y40/00 ,  C01B32/162 ,  C01B2202/34 ,  C01B2202/36 ,  C23C16/04 ,  C23C16/26 ,  D01F9/08 ,  D01F9/127 ,  H01B1/04 ,  H01J1/304 ,  H01J3/022 ,  H01J9/025 ,  H01J2201/30469 ,  H01J2237/31786 ,  H01L21/76876 ,  H01L21/76885 ,  H01L23/53276 ,  H01L29/0676 ,  H01L51/0003 ,  H01L51/0048 ,  H01L51/0052 ,  H01L51/0512 ,  H01L2221/1089 ,  H01L2221/1094 ,  Y10S977/734 ,  Y10S977/742 ,  Y10S977/75 ,  Y10S977/814 ,  Y10S977/842 ,  Y10S977/86

摘要： The present invention relates to a heat dissipator that includes a conductive substrate and a plurality of nanostructures supported by the conductive substrate. The nanostructures are at least partly embedded in an insulator. Each of the nanostructures includes a plurality of intermediate layers on the conductive substrate. At least two of the plurality of intermediate layers are interdiffused, and material of the at least two of the plurality of intermediate layers that are interdiffused is present in the nanostructure.

摘要翻译： 散热器技术领域本发明涉及一种散热器，其包括导电基板和由导电基板支撑的多个纳米结构体。 纳米结构至少部分地嵌入绝缘体中。 每个纳米结构在导电基底上包括多个中间层。 多个中间层中的至少两个相互扩散，并且相互扩散的多个中间层中的至少两个中间层的材料存在于纳米结构中。

公开(公告)号：US08187673B2

公开(公告)日：2012-05-29

申请号：US11933251

申请日：2007-10-31

申请人： Chad A. Mirkin ,  Richard Piner ,  Seunghun Hong

发明人： Chad A. Mirkin ,  Richard Piner ,  Seunghun Hong

IPC分类号： B05D3/00

CPC分类号： B82B3/00 ,  B05D1/007 ,  B05D1/185 ,  B05D1/26 ,  G01Q80/00 ,  G03F7/0002 ,  G03F7/165 ,  Y10S977/849 ,  Y10S977/853 ,  Y10S977/854 ,  Y10S977/855 ,  Y10S977/856 ,  Y10S977/857 ,  Y10S977/86 ,  Y10S977/88 ,  Y10S977/884 ,  Y10S977/885 ,  Y10S977/886 ,  Y10S977/895 ,  Y10T428/24802

摘要： The invention provides a lithographic method referred to as “dip pen” nanolithography (DPN). DPN utilizes a scanning probe microscope (SPM) tip (e.g., an atomic force microscope (AFM) tip) as a “pen,” a solid-state substrate (e.g., gold) as “paper,” and molecules with a chemical affinity for the solid-state substrate as “ink.” Capillary transport of molecules from the SPM tip to the solid substrate is used in DPN to directly write patterns consisting of a relatively small collection of molecules in submicrometer dimensions, making DPN useful in the fabrication of a variety of microscale and nanoscale devices. The invention also provides substrates patterned by DPN, including submicrometer combinatorial arrays, and kits, devices and software for performing DPN. The invention further provides a method of performing AFM imaging in air. The method comprises coating an AFM tip with a hydrophobic compound, the hydrophobic compound being selected so that AFM imaging performed using the coated AFM tip is improved compared to AFM imaging performed using an uncoated AFM tip. Finally, the invention provides AFM tips coated with the hydrophobic compounds.

摘要翻译： 本发明提供了称为“浸笔”纳米光刻（DPN）的光刻方法。 DPN使用扫描探针显微镜（SPM）尖端（例如，原子力显微镜（AFM）尖端）作为“笔”，固态基底（例如，金）作为“纸”，并且具有化学亲和力的分子 固体底物作为“墨水”。DPN中使用分子从SPM尖端到固体基质的毛细管转运，以直接写入由亚微米尺寸的相对小的分子集合组成的图案，使得DPN可用于制造 各种微米级和纳米级器件。 本发明还提供由DPN图案化的衬底，包括亚微米组合阵列，以及用于执行DPN的试剂盒，装置和软件。 本发明还提供了一种在空气中进行AFM成像的方法。 该方法包括用疏水性化合物涂覆AFM尖端，选择疏水性化合物，使得与使用未涂覆的AFM尖端进行的AFM成像相比，使用涂覆的AFM尖端进行的AFM成像得到改善。 最后，本发明提供涂覆有疏水化合物的AFM尖端。

公开(公告)号：US08046843B2

公开(公告)日：2011-10-25

申请号：US12423747

申请日：2009-04-14

申请人： Victor B. Kley

发明人： Victor B. Kley

IPC分类号： G01Q70/14

CPC分类号： G03F1/84 ,  G01B7/31 ,  G01Q80/00 ,  G03F7/70375 ,  G03F7/70483 ,  G11B5/232 ,  G11B5/3116 ,  G11B9/06 ,  G11B9/08 ,  G11B9/14 ,  G11B9/1409 ,  G11B9/1418 ,  G11B9/1427 ,  G11B9/1436 ,  G11B9/1445 ,  G11B9/1454 ,  G11B9/149 ,  G11B11/007 ,  G11B11/05 ,  G11B11/12 ,  G11B11/16 ,  G11B2005/0002 ,  G11B2005/0021 ,  H02N1/006 ,  Y10S977/851 ,  Y10S977/86 ,  Y10S977/875 ,  Y10S977/877

摘要： An instrument includes a probe having a porous tip, a tip positioning apparatus to position the tip with respect to a sample material, a probe positioning apparatus to position the probe and sample material with respect to each other, and a controller. The controller controls the probe positioning apparatus in positioning the probe over the sample and controls the tip positioning apparatus in lowering the tip into the sample material to produce an interaction between the porous tip and the sample material.

摘要翻译： 一种仪器包括具有多孔尖端的探针，用于相对于样品材料定位尖端的末端定位装置，将探针和样品材料相对于彼此定位的探针定位装置，以及控制器。 控制器控制探头定位装置将探针定位在样品上，并控制尖端定位装置将尖端降低到样品材料中，以产生多孔尖端和样品材料之间的相互作用。

公开(公告)号：US07917966B2

公开(公告)日：2011-03-29

申请号：US12196194

申请日：2008-08-21

申请人： Yong Hyup Kim ,  Wal Jun Kim

发明人： Yong Hyup Kim ,  Wal Jun Kim

IPC分类号： G01Q70/12

CPC分类号： G01Q70/12 ,  Y10S977/849 ,  Y10S977/86 ,  Y10S977/902 ,  Y10S977/947

摘要： Techniques for fabricating carbon nanotubes aligned on a tip are provided. In one embodiment, a method for fabricating carbon nanotubes aligned on a tip includes forming nanostructures on the tip, and aligning the nanostructures on the tip using a fluid flowing on the tip.

摘要翻译： 提供了用于制造在尖端上对齐的碳纳米管的技术。 在一个实施例中，用于制造在尖端上对准的碳纳米管的方法包括在尖端上形成纳米结构，并使用在尖端上流动的流体对准尖端上的纳米结构。

公开(公告)号：US07735357B2

公开(公告)日：2010-06-15

申请号：US11587207

申请日：2005-04-20

申请人： Masashi Kitazawa ,  Ryo Ota ,  Masaki Tanemura

发明人： Masashi Kitazawa ,  Ryo Ota ,  Masaki Tanemura

IPC分类号： G01B5/28

CPC分类号： G01Q70/12 ,  Y10S977/849 ,  Y10S977/86

摘要： An SPM cantilever of the present invention including: a support portion (1) fabricated by processing a single crystal silicon wafer; a lever portion (2) formed in a manner extended from the support portion; a probe (3) disposed at a free end side of the lever portion; a coating of graphite film (5) covering all over the side on which the probe is formed and the entire probe; and a piece of thin line (6) consisting of a carbon nanofiber (CNF) or carbon nanotube (CNT) or graphite nanofiber (GNF) grown/formed from the graphite film at a probe terminal end portion (3a).

摘要翻译： 本发明的SPM悬臂包括：通过处理单晶硅晶片制造的支撑部分（1）; 以从所述支撑部延伸的方式形成的杆部（2） 设置在所述杆部的自由端侧的探针（3） 覆盖在其上形成探针的一侧的整个探针的石墨膜（5）涂层; 以及由在探针末端部分（3a）由石墨膜生长/形成的碳纳米纤维（CNF）或碳纳米管（CNT）或石墨纳米纤维（GNF）组成的细线（6）。

公开(公告)号：US07543482B2

公开(公告)日：2009-06-09

申请号：US11710974

申请日：2007-02-27

申请人： Masashi Kitazawa ,  Masaki Tanemura ,  Junya Tanaka ,  Tatsuhiko Okita

发明人： Masashi Kitazawa ,  Masaki Tanemura ,  Junya Tanaka ,  Tatsuhiko Okita

IPC分类号： G12B21/08 ,  B82B1/00

CPC分类号： G01Q70/12 ,  C12N15/89 ,  G01Q60/54 ,  Y10S977/86 ,  Y10S977/863 ,  Y10S977/875 ,  Y10S977/876 ,  Y10S977/879

摘要： A carbon thin line probe having a carbon thin line selectively formed at a projection-like terminal end portion thereof by means of an irradiation of high-energy beam, the carbon thin line internally containing a metal. Thereby achieved is a carbon thin line probe suitable for example for the probe of SPM cantilever, which has a high aspect ratio and high durability and reliability, capability of batch processing based on a simple manufacturing method, and to which magnetic characteristic can be imparted.

摘要翻译： 一种碳细线探针，其具有通过高能束的照射在其突起状端部选择性地形成的碳细线，所述碳细线在内部含有金属。 由此实现了适用于例如SPM悬臂的探针的碳细线探针，其具有高纵横比和高耐久性和可靠性，基于简单制造方法的批处理能力，并且可赋予其磁特性。

公开(公告)号：US07507957B2

公开(公告)日：2009-03-24

申请号：US11216389

申请日：2005-08-31

申请人： Masamichi Fujihira ,  Masatoshi Yasutake ,  Tatsuaki Ataka

发明人： Masamichi Fujihira ,  Masatoshi Yasutake ,  Tatsuaki Ataka

IPC分类号： G01N23/00

CPC分类号： G01Q30/14 ,  G01Q10/06 ,  Y10S977/853 ,  Y10S977/86 ,  Y10S977/862 ,  Y10S977/869 ,  Y10S977/871

摘要： A problem to be resolved by the invention resides in providing a multifunction analyzing apparatus for detecting a shape with high resolution and physical property information capable of not only successively reading a base arrangement from end to end but also specifying a position hybridized by known RNA with regard to a single piece of DNA elongated in one direction on a board. A microscope system of the invention is provided with a fluorescence microscope, a scanning near field microscope and a scanning probe microscope as a detecting system, the microscopes are fixed to a switching mechanism and can be moved to a position at which the various microscopes can observe the same portion of a sample by switching operation of the mechanism. The microscope system of the invention is provided with a function capable of directly detecting a shape and physical property information of one piece of DNA by the scanning probe microscope by multifunction scanning.

摘要翻译： 本发明要解决的问题在于提供一种用于检测具有高分辨率和物理属性信息的形状的多功能分析装置，其不仅能够从一端到另一端连续读取基本排列，而且还指定与已知RNA杂交的位置 到在板上沿一个方向伸长的单个DNA。 本发明的显微镜系统设置有荧光显微镜，扫描型近场显微镜和扫描探针显微镜作为检测系统，将显微镜固定在切换机构上，并可移动到各种显微镜可以观察到的位置 通过切换机构的操作来获取样品的相同部分。 本发明的显微镜系统具有能够通过扫描探针显微镜通过多功能扫描直接检测一片DNA的形状和物理性质信息的功能。

公开(公告)号：US07459682B2

公开(公告)日：2008-12-02

申请号：US11559842

申请日：2006-11-14

申请人： Wen-Hui Duan ,  Shao-Gang Hao ,  Gang Zhou ,  Jian Wu ,  Bing-Lin Gu

发明人： Wen-Hui Duan ,  Shao-Gang Hao ,  Gang Zhou ,  Jian Wu ,  Bing-Lin Gu

IPC分类号： G01N23/00

CPC分类号： H01J1/304 ,  G01Q60/16 ,  H01J2201/30434 ,  H01J2201/30488 ,  H01J2203/0296 ,  Y10S977/815 ,  Y10S977/822 ,  Y10S977/838 ,  Y10S977/849 ,  Y10S977/86 ,  Y10S977/861

摘要： An exemplary spin-polarized electron source includes a cathode, and a one-dimensional nanostructure made of a compound (e.g., group III-V) semiconductor with local polarized gap states. The one-dimensional nanostructure includes a first end portion electrically connected with the cathode and a second end portion located/directed away from the cathode. The second end portion of the one-dimensional nanostructure functions as a polarized electron emission tip and is configured (i.e., structured and arranged) for emitting a spin-polarized electron current/beam under an effect of selectably one of a magnetic field induction and a circularly polarized light beam excitation when a predetermined negative bias voltage is applied to the cathode. Furthermore, a spin-polarized scanning tunneling microscope incorporating such a spin-polarized electron source is also provided.

摘要翻译： 示例性的自旋极化电子源包括阴极和由具有局部极化间隙状态的化合物（例如III-V族）半导体制成的一维纳米结构。 一维纳米结构包括与阴极电连接的第一端部和位于/远离阴极的第二端部。 一维纳米结构的第二端部用作极化电子发射尖端，并且被配置（即，构造和布置），用于在可选择地对磁场感应和 当向阴极施加预定的负偏压时，圆偏振光束激发。 此外，还提供了包含这种自旋极化电子源的自旋极化扫描隧道显微镜。

公开(公告)号：US20080054168A1

公开(公告)日：2008-03-06

申请号：US11848283

申请日：2007-08-31

申请人： Kazunori Hoshino ,  Xiaojing Zhang

发明人： Kazunori Hoshino ,  Xiaojing Zhang

IPC分类号： G12B21/06 ,  B44C1/22

CPC分类号： G01Q60/22 ,  Y10S977/849 ,  Y10S977/86 ,  Y10S977/862

摘要： An improved near-field scanning optical microscope probe is disclosed. The near-field scanning optical microscope probe includes a probe body and two electrodes extending from the probe body to form a probe tip. In addition, a light-emitting diode is disposed between the two electrodes at the probe tip to act as a light source for the near-field scanning optical microscope probe.

摘要翻译： 公开了一种改进的近场扫描光学显微镜探针。 近场扫描光学显微镜探针包括探针体和从探针体延伸以形成探针尖端的两个电极。 此外，在探针尖端的两个电极之间设置有发光二极管，作为近场扫描光学显微镜探针的光源。

公开(公告)号：US20070240516A1

公开(公告)日：2007-10-18

申请号：US11818669

申请日：2007-06-15

申请人： Marcin Bauza ,  Shane Woody ,  Stuart Smith

发明人： Marcin Bauza ,  Shane Woody ,  Stuart Smith

IPC分类号： G12B21/20

CPC分类号： B25J7/00 ,  B25J15/022 ,  B25J15/10 ,  G01Q80/00 ,  Y10S977/849 ,  Y10S977/85 ,  Y10S977/851 ,  Y10S977/86 ,  Y10S977/863 ,  Y10S977/872 ,  Y10S977/873 ,  Y10S977/876 ,  Y10S977/88

摘要： The present invention provides a self-sensing tweezer device for micro and nano-scale manipulation, assembly, and surface modification, including: one or more elongated beams disposed in a first configuration; one or more oscillators coupled to the one or more elongated beams, wherein the one or more oscillators are operable for selectively oscillating the one or more elongated beams to form one or more “virtual” probe tips; and an actuator coupled to the one or more elongated beams, wherein the actuator is operable for selectively actuating the one or more elongated beams from the first configuration to a second configuration.

摘要翻译： 本发明提供一种用于微尺度和纳米尺度操纵，组装和表面改性的自感镊子装置，包括：一个或多个沿第一构型设置的细长梁; 耦合到所述一个或多个细长波束的一个或多个振荡器，其中所述一个或多个振荡器可操作用于选择性地振荡所述一个或多个细长波束以形成一个或多个“虚拟”探针尖端; 以及联接到所述一个或多个细长梁的致动器，其中所述致动器可操作以选择性地将所述一个或多个细长梁从所述第一构型激活到第二构型。