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公开(公告)号:US20170287860A1
公开(公告)日:2017-10-05
申请号:US15088711
申请日:2016-04-01
IPC分类号: H01L23/00
CPC分类号: H01L24/13 , H01L24/11 , H01L24/14 , H01L2224/11464 , H01L2224/13083 , H01L2224/13111 , H01L2224/13155 , H01L2224/13164 , H01L2224/1403
摘要: An electroless nickel, electroless palladium, electroless tin stack and associated methods are shown. An example method to form a solder bump may include forming a layer of a second material over a first material at a base of a trench in a solder resist layer. The first material includes nickel and the second material includes palladium. The method further includes depositing a third material that includes tin on the second material using an electroless deposition process, and forming a solder bump out of the third material using a reflow and deflux process.