公开(公告)号：US10937921B2

公开(公告)日：2021-03-02

申请号：US14408368

申请日：2012-06-21

申请人： Dominique Biava ,  Mathieu Rault ,  Jean-Marc Inglese ,  Sylvie Bothorel ,  Didier Gourier ,  Laurent Binet ,  Philippe Barboux ,  Jean-Pierre Ponpon

发明人： Dominique Biava ,  Mathieu Rault ,  Jean-Marc Inglese ,  Sylvie Bothorel ,  Didier Gourier ,  Laurent Binet ,  Philippe Barboux ,  Jean-Pierre Ponpon

IPC分类号： H01L31/18 ,  H01L31/08 ,  A61B6/14 ,  H01L31/0368

摘要： This invention relates to a method to manufacture a chip to detect the direct conversion of X-rays. It also relates to a direct conversion detector for X-rays using such a chip and dental radiology equipment using at least one such detector. The method to manufacture the wafer comprises a step for applying pressure (3, 4, 4 a) to a powdered polycrystalline semiconductor material and a step for heating (5-9) during a set time period. It comprises a preliminary step for providing an impurity level of at least 0.2% in the polycrystalline semiconductor material.

公开(公告)号：US20150155421A1

公开(公告)日：2015-06-04

申请号：US14408368

申请日：2012-06-21

申请人： Dominique Biava ,  Mathieu Rault ,  Jean-Marc Inglese ,  Sylvie Bothorel ,  Didier Gourier ,  Laurent Binet ,  Philippe Barboux ,  Jean-Pierre Ponpon

发明人： Dominique Biava ,  Mathieu Rault ,  Jean-Marc Inglese ,  Sylvie Bothorel ,  Didier Gourier ,  Laurent Binet ,  Philippe Barboux ,  Jean-Pierre Ponpon

IPC分类号： H01L31/18 ,  H01L31/08 ,  A61B6/14 ,  H01L31/0368

CPC分类号： H01L31/18 ,  A61B6/14 ,  A61B6/145 ,  C04B35/01 ,  C04B35/5152 ,  C04B35/645 ,  C04B2235/3296 ,  C04B2235/444 ,  G01T1/24 ,  H01L31/02966 ,  H01L31/032 ,  H01L31/0368 ,  H01L31/085

摘要： This invention relates to a method to manufacture a chip to detect the direct conversion of X-rays. It also relates to a direct conversion detector for X-rays using such a chip and dental radiology equipment using at least one such detector.The method to manufacture the wafer comprises a step for applying pressure (3, 4, 4a) to a powdered polycrystalline semiconductor material and a step for heating (5-9) during a set time period. It comprises a preliminary step for providing an impurity level of at least 0.2% in the polycrystalline semiconductor material.

摘要翻译： 本发明涉及一种制造芯片以检测X射线直接转换的方法。 它还涉及使用这种使用至少一个这种检测器的芯片和牙科放射学设备进行X射线的直接转换检测器。 制造晶片的方法包括在设定的时间段内对粉末状多晶半导体材料施加压力（3,4,4a）和加热步骤（5-9）的步骤。 它包括在多晶半导体材料中提供至少0.2％的杂质水平的预备步骤。

公开(公告)号：US09938916B2

公开(公告)日：2018-04-10

申请号：US12671267

申请日：2007-08-16

申请人： Florent Giovaresco ,  Peter Osterberg ,  Mathieu Rault

发明人： Florent Giovaresco ,  Peter Osterberg ,  Mathieu Rault

IPC分类号： G06F7/00 ,  F02D41/02 ,  B60W50/04 ,  F02D41/24 ,  F02D41/26 ,  G06F9/445 ,  G07C5/08 ,  B60W10/06 ,  B60W10/10 ,  B60W30/18 ,  B60W40/02 ,  B60W40/072 ,  B60W40/076 ,  B60W50/00 ,  G07C5/00

CPC分类号： F02D41/021 ,  B60W10/06 ,  B60W10/10 ,  B60W30/18 ,  B60W30/18172 ,  B60W40/02 ,  B60W40/072 ,  B60W40/076 ,  B60W50/045 ,  B60W2050/0077 ,  B60W2550/402 ,  F02D41/2429 ,  F02D41/266 ,  F02D2200/606 ,  G06F9/44505 ,  G07C5/008 ,  G07C5/0808

摘要： This system is used for adjusting the control parameters of an onboard electronic control device of an automotive vehicle in view of a journey or type of journey. This system includes a computation arrangement adapted to generate a set of control parameters to be used by the electronic control device and an input arrangement adapted to allow a user to provide the computation arrangement with data relating to the journey or type of journey and to at least one constraint to be considered as having priority during the journey or type of journey. In the method of the invention, one collects data with respect to the vehicle, to the journey or type of journey and to the constraint to be considered as having priority. These data are provided to the computation arrangement which generate a set of control parameters for the control device.

公开(公告)号：US20100204882A1

公开(公告)日：2010-08-12

申请号：US12671267

申请日：2007-08-16

申请人： Florent Giovaresco ,  Peter Osterberg ,  Mathieu Rault

发明人： Florent Giovaresco ,  Peter Osterberg ,  Mathieu Rault

IPC分类号： G06F7/00 ,  G06G7/48

CPC分类号： F02D41/021 ,  B60W10/06 ,  B60W10/10 ,  B60W30/18 ,  B60W30/18172 ,  B60W40/02 ,  B60W40/072 ,  B60W40/076 ,  B60W50/045 ,  B60W2050/0077 ,  B60W2550/402 ,  F02D41/2429 ,  F02D41/266 ,  F02D2200/606 ,  G06F9/44505 ,  G07C5/008 ,  G07C5/0808

摘要： This system is used for adjusting the control parameters of an onboard electronic control device of an automotive vehicle in view of a journey or type of journey. This system includes a computation arrangement adapted to generate a set of control parameters to be used by the electronic control device and an input arrangement adapted to allow a user to provide the computation arrangement with data relating to the journey or type of journey and to at least one constraint to be considered as having priority during the journey or type of journey. In the method of the invention, one collects data with respect to the vehicle, to the journey or type of journey and to the constraint to be considered as having priority. These data are provided to the computation arrangement which generate a set of control parameters for the control device.

摘要翻译： 考虑到行程或行程类型，该系统用于调整机动车辆的车载电子控制装置的控制参数。 该系统包括适于产生要由电子控制装置使用的一组控制参数的计算装置和适于允许用户向计算装置提供与行程或类型的旅程相关的数据的输入装置，并且至少 在旅途中或旅程类型中被视为优先考虑的一个限制。 在本发明的方法中，人们收集关于车辆的数据，旅程或行程类型以及被认为具有优先权的约束。 这些数据被提供给生成用于控制装置的一组控制参数的计算装置。