公开(公告)号：US20110279893A1

公开(公告)日：2011-11-17

申请号：US12998667

申请日：2009-11-17

申请人： E. Szilveszter Vizi ,  Gergely Katona ,  J. Balazs Rozsa

发明人： E. Szilveszter Vizi ,  Gergely Katona ,  J. Balazs Rozsa

IPC分类号： G02B21/06

CPC分类号： G02B21/002

摘要： The present invention relates to a laser scanning microscope (10) for scanning a sample, the microscope having focusing means (15) having a focal plane (29) and comprising at least one optical element for focusing a laser beam (13), drive means (18) for displacing the at least one optical element of the focusing means (15), at least one detector means (24′) for detecting light (13′) reflected from the sample or back fluoresced light (13′) emitted by the sample, characterised by the detector means (24′) being connected to the drive means (18) such that the drive means (18) may simultaneously displace the detector means (24′) with the at least one optical element of the focusing means (15). The present invention further relates to a method of performing 3D scanning with the inventive laser scanning microscope.

摘要翻译： 本发明涉及一种用于扫描样品的激光扫描显微镜（10），该显微镜具有聚焦装置（15），该聚焦装置具有焦平面（29），并包括用于聚焦激光束（13）的至少一个光学元件，驱动装置 （18），用于移动所述聚焦装置（15）的所述至少一个光学元件;至少一个检测器装置（24'），用于检测从所述样品反射的光或反射的荧光的光（13'）， 样品，其特征在于检测器装置（24'）连接到驱动装置（18），使得驱动装置（18）可以与聚焦装置的至少一个光学元件同时移动检测器装置（24'） 15）。 本发明还涉及使用本发明的激光扫描显微镜执行3D扫描的方法。

公开(公告)号：US20120044569A1

公开(公告)日：2012-02-23

申请号：US13138059

申请日：2009-12-30

申请人： Pal Andor Maak ,  J. Balazs Rozsa ,  Gergely Katona ,  E. Szilveszter Vizi ,  Mate Veress ,  Attila Csakanyi ,  Gergely Szalay

发明人： Pal Andor Maak ,  J. Balazs Rozsa ,  Gergely Katona ,  E. Szilveszter Vizi ,  Mate Veress ,  Attila Csakanyi ,  Gergely Szalay

IPC分类号： G02B27/40 ,  G02B27/28

CPC分类号： G02F1/33 ,  G02F2201/16 ,  G02F2203/28

摘要： The present invention relates to a focusing system (100) for focusing an electromagnetic beam for three-dimensional random access applications, the system comprising a first pair of acousto-optic deflectors (10) for focusing an electromagnetic beam in an X-Z plane, and a second pair of acousto-optic deflectors (20) for focusing an electromagnetic beam in a Y-Z plane being substantially perpendicular to the X-Z plane, characterised in that the second pair of acousto-optic deflectors (20) are arranged between the acousto-optic deflectors (12, 12′) of the first pair of acousto-optic deflectors (10), such that the first and fourth acousto-optic deflectors (12, 12″) of the system belong to the first pair of acousto-optic deflectors (10) and the second and third acousto-optic deflectors (22, 22″) of the system belong to the second pair of acousto-optic deflectors (20).

摘要翻译： 本发明涉及用于聚焦用于三维随机存取应用的电磁束的聚焦系统（100），该系统包括用于将电磁束聚焦在XZ平面中的第一对声光偏转器（10）和 第二对声光偏转器（20），用于将基本垂直于XZ平面的YZ平面中的电磁束聚焦，其特征在于，所述第二对声光偏转器（20）布置在所述声光偏转器 12,12'），使得系统的第一和第四声光偏转器（12,12“）属于第一对声光偏转器（10），该声光偏转器 并且系统的第二和第三声光偏转器（22,22“）属于第二对声光偏转器（20）。

公开(公告)号：US09030547B2

公开(公告)日：2015-05-12

申请号：US12998668

申请日：2009-11-17

申请人： E. Szilveszter Vizi ,  Gergely Katona ,  J. Balazs Rozsa ,  Attila Kaszas ,  Gergely Turi

发明人： E. Szilveszter Vizi ,  Gergely Katona ,  J. Balazs Rozsa ,  Attila Kaszas ,  Gergely Turi

IPC分类号： H04N7/18 ,  G02B21/06 ,  G02B21/36 ,  G02B26/10 ,  G02B21/00

CPC分类号： G02B21/0036 ,  G02B21/365 ,  G02B26/101 ,  G02B26/105

摘要： The invention relates to a method for carrying out measurements on at least one region of interest within a sample via a laser scanning microscope having focusing means for focusing a laser beam and having electro-mechano-optic deflector for deflecting the laser beam, the method comprising: providing a scanning trajectory for the at least one region of interest; providing a sequence of measurements and the corresponding scanning trajectories; providing cross-over trajectories between the scanning trajectories of two consecutive measurements; deflecting the laser beam via the electro-mechano-optic means for moving a focus spot of the focused laser beam along a scanning trajectory at an average scanning speed; and deflecting the laser beam via the electro-mechano-optic means for moving the focus spot of the laser beam along a cross-over trajectory at a cross-over speed having a maximum, the maximum of the cross-over speed being higher than the average scanning speed. The invention further relates to a measuring system for implementing the method according to the invention

摘要翻译： 本发明涉及一种通过具有聚焦装置的激光扫描显微镜对样品内的至少一个感兴趣区域进行测量的方法，该聚焦装置用于聚焦激光束并具有用于偏转激光束的电机械光学偏转器，该方法包括 ：为所述至少一个感兴趣区域提供扫描轨迹; 提供测量序列和相应的扫描轨迹; 在两个连续测量的扫描轨迹之间提供交叉轨迹; 通过电机械光学装置偏转激光束，用于以平均扫描速度沿着扫描轨迹移动聚焦激光束的聚焦点; 并且经由电机械光学装置偏转激光束，用于沿着具有最大值的交叉速度沿着交叉轨迹移动激光束的聚焦点，交叉速度的最大值高于 平均扫描速度。 本发明还涉及一种用于实现根据本发明的方法的测量系统

公开(公告)号：US08559085B2

公开(公告)日：2013-10-15

申请号：US13138059

申请日：2009-12-30

申请人： Pal Andor Maak ,  J. Balazs Rozsa ,  Gergely Katona ,  E. Szilveszter Vizi ,  Mate Veress ,  Attila Csakanyi ,  Gergely Szalay

发明人： Pal Andor Maak ,  J. Balazs Rozsa ,  Gergely Katona ,  E. Szilveszter Vizi ,  Mate Veress ,  Attila Csakanyi ,  Gergely Szalay

IPC分类号： G02B26/08

CPC分类号： G02F1/33 ,  G02F2201/16 ,  G02F2203/28

摘要： A focusing system for focusing an electromagnetic beam for three-dimensional random access applications comprises a first pair of acousto-optic deflectors for focusing an electromagnetic beam in an X-Z plane, and a second pair of acousto-optic deflectors for focusing an electromagnetic beam in a Y-Z plane substantially perpendicular to the X-Z plane. The second pair of acousto-optic deflectors is arranged between the acousto-optic deflectors of the first pair of acousto-optic deflectors such that the first and fourth acousto-optic deflectors of the system belong to the first pair of acousto-optic deflectors and the second and third acousto-optic deflectors of the system belong to the second pair of acousto-optic deflectors.

摘要翻译： 用于聚焦用于三维随机存取应用的电磁束的聚焦系统包括用于将电磁束聚焦在XZ平面中的第一对声光偏转器和用于将电磁光束聚焦在XZ平面中的第二对声光偏转器 基本上垂直于XZ平面的YZ平面。 第二对声光偏转器布置在第一对声光偏转器的声光偏转器之间，使得系统的第一和第四声光偏转器属于第一对声光偏转器，并且 系统的第二和第三声光偏转器属于第二对声光偏转器。

公开(公告)号：US09081173B2

公开(公告)日：2015-07-14

申请号：US12737426

申请日：2009-07-14

申请人： E. Szilveszter Vizi ,  Gergely Katona ,  J. Balazs Rozsa

发明人： E. Szilveszter Vizi ,  Gergely Katona ,  J. Balazs Rozsa

IPC分类号： G02B21/00

CPC分类号： G02B21/0048 ,  G02B21/006 ,  G02B21/0084

摘要： A laser scanning microscope is provided with a laser beam focusing device, a drive for the focusing device, a laser beam deflector, and a control system that coordinates movement of the focusing device with that of the laser beam deflector.

摘要翻译： 激光扫描显微镜设置有激光束聚焦装置，用于聚焦装置的驱动器，激光束偏转器和控制聚焦装置与激光束偏转器的移动的控制系统。

公开(公告)号：US20110279667A1

公开(公告)日：2011-11-17

申请号：US12998668

申请日：2009-11-17

申请人： E. Szilveszter Vizi ,  Gergely Katona ,  J. Balazs Rozsa ,  Attila Kaszas ,  Gergely Turi

发明人： E. Szilveszter Vizi ,  Gergely Katona ,  J. Balazs Rozsa ,  Attila Kaszas ,  Gergely Turi

IPC分类号： H04N7/18 ,  G02B21/06 ,  G02B21/36 ,  G02B26/10

CPC分类号： G02B21/0036 ,  G02B21/365 ,  G02B26/101 ,  G02B26/105

摘要： The invention relates to a method for carrying out measurements on at least one region of interest within a sample via a laser scanning microscope having focusing means for focusing a laser beam and having electro-mechano-optic deflector for deflecting the laser beam, the method comprising: providing a scanning trajectory for the at least one region of interest; providing a sequence of measurements and the corresponding scanning trajectories; providing cross-over trajectories between the scanning trajectories of two consecutive measurements; deflecting the laser beam via the electro-mechano-optic means for moving a focus spot of the focused laser beam along a scanning trajectory at an average scanning speed; and deflecting the laser beam via the electro-mechano-optic means for moving the focus spot of the laser beam along a cross-over trajectory at a cross-over speed having a maximum, the maximum of the cross-over speed being higher than the average scanning speed. The invention further relates to a measuring system for implementing the method according to the invention

摘要翻译： 本发明涉及一种通过具有聚焦装置的激光扫描显微镜对样品内的至少一个感兴趣区域进行测量的方法，该聚焦装置用于聚焦激光束并具有用于偏转激光束的电机械光学偏转器，该方法包括 ：为所述至少一个感兴趣区域提供扫描轨迹; 提供测量序列和相应的扫描轨迹; 在两个连续测量的扫描轨迹之间提供交叉轨迹; 通过电机械光学装置偏转激光束，用于以平均扫描速度沿着扫描轨迹移动聚焦激光束的聚焦点; 并且经由电机械光学装置偏转激光束，用于沿着具有最大值的交叉速度沿着交叉轨迹移动激光束的聚焦点，交叉速度的最大值高于 平均扫描速度。 本发明还涉及一种用于实现根据本发明的方法的测量系统

公开(公告)号：US20110211254A1

公开(公告)日：2011-09-01

申请号：US12737426

申请日：2009-07-14

申请人： E. Szilveszter Vizi ,  Gergely Katona ,  J. Balazs Rozsa

发明人： E. Szilveszter Vizi ,  Gergely Katona ,  J. Balazs Rozsa

IPC分类号： G02B21/06

CPC分类号： G02B21/0048 ,  G02B21/006 ,  G02B21/0084

摘要： The invention relates to a laser scanning microscope (10) having: focusing means (15) having a focal plane (29) and comprising at least one optical element for focusing a laser beam (13); drive means (18) for displacing the at least one optical element of the focusing means (15) for changing the position of the focal plane (29), and deflecting means (14) for deflecting the laser beam (13). The microscope comprises a control system (32) configured to carry out the steps of: providing a periodical drive signal for the drive means (18); obtaining time dependant displacement data of the at least one optical element of the focusing means (15) in response to the periodical drive signal of the drive means (18); providing a response function (z(t)) using the time dependant displacement data, calculating a drive signal for the deflecting means (14) using the response function (z(t)) to move the focal volume (30) of the laser beam (13) along a given 3D trajectory (48) within a sample to be examined. The invention further relates to a method for carrying out such a scanning operation along a 3D trajectory (48).

摘要翻译： 本发明涉及一种具有聚焦装置（15）的激光扫描显微镜（10），该聚焦装置具有聚焦平面（29）并且包括用于聚焦激光束（13）的至少一个光学元件; 用于移动用于改变焦平面（29）的位置的聚焦装置（15）的至少一个光学元件的驱动装置（18）和用于偏转激光束（13）的偏转装置（14）。 显微镜包括配置成执行以下步骤的控制系统（32）：为驱动装置（18）提供周期性的驱动信号; 响应于驱动装置（18）的周期性驱动信号，获得聚焦装置（15）的至少一个光学元件的时间相关位移数据; 使用时间相关位移数据提供响应函数（z（t）），使用响应函数（z（t））计算用于偏转装置（14）的驱动信号，以移动激光束的焦点体积（30） （13）沿着待检查的样本内的给定3D轨迹（48）。 本发明还涉及一种沿3D轨迹（48）执行这种扫描操作的方法。