公开(公告)号：USD788612S1

公开(公告)日：2017-06-06

申请号：US29554373

申请日：2016-02-11

Applicant: EXFO INC.

Designer： Denis Lafrance ,  Antoine-Alexandre Michaud

公开(公告)号：USD764328S1

公开(公告)日：2016-08-23

申请号：US29525702

申请日：2015-05-01

Applicant: EXFO INC.

Designer： Denis Lafrance ,  Sébastien Nadeau

公开(公告)号：US10175142B2

公开(公告)日：2019-01-08

申请号：US15193180

申请日：2016-06-27

Applicant: EXFO INC.

Inventor： Denis Lafrance ,  Bernard Ruchet ,  Robert Baribault

IPC: G01N21/00 ,  G01M11/00 ,  G06T7/00 ,  H04N5/225 ,  H04B10/00 ,  G02B6/38 ,  G02B21/00

Abstract: An inspection system for inspecting a multiple-fiber connector is provided. The inspection system includes a microscope probe and a probe tip configured to provide an optical path between the microscope probe and the multiple-fiber connector. The probe tip and microscope probe are configured so that the field of view of the microscope probe is sufficiently large to cover a portion of the connector surface encompassing a plurality of the optical fiber endfaces. The system further includes a shifting mechanism operable to shift the field of view of the microscope probe between at least two discrete positions over the connector surface. Each discrete position encompasses a different subset of the multiple optical fiber endfaces and optionally at least one positioning reference. A probe tip and a method of inspection are also provided.

公开(公告)号：USD751434S1

公开(公告)日：2016-03-15

申请号：US29511590

申请日：2014-12-11

Applicant: EXFO INC.

Designer： Sébastien Nadeau ,  Denis Lafrance