公开(公告)号：US11852582B2

公开(公告)日：2023-12-26

申请号：US17879665

申请日：2022-08-02

Applicant: East China Normal University

Inventor： Liangqing Zhu ,  Junli Wang ,  Liyan Shang ,  Le Wang ,  Zhigao Hu

IPC: G01N21/35 ,  G01N21/3563 ,  G01N21/01

CPC classification number: G01N21/3563 ,  G01N21/01 ,  G01N2021/3595 ,  G01N2201/023

Abstract: An automatic photocurrent spectrum measurement system based on a Fourier infrared spectrometer, including a light source component, an environment control component, a measuring module, and a control module. The system is configured to evaluate photoelectric performance semiconductor materials or devices under different temperatures, voltage biases or current biases.