公开(公告)号：US20140075251A1

公开(公告)日：2014-03-13

申请号：US13865206

申请日：2013-04-18

Applicant: ETRON TECHNOLOGY, INC.

Inventor： Shih-Hsing Wang ,  Ming-Cheng Liang ,  Kuo-Cheng Ting

IPC: G11C29/12

CPC classification number: G11C29/12 ,  G11C29/022 ,  G11C29/1201

Abstract: A method capable of improving test coverage of chip pads, where the chip includes a control unit, a plurality of pads, and a storage unit, is disclosed. The storage unit includes a plurality of blocks. The method includes writing test data to a first predetermined block through a predetermined pad of the plurality of pads, controlling a first pad to read and store a predetermined datum of the test data from the first predetermined block, controlling the first pad to write the predetermined datum to a second predetermined block, reading the predetermined datum stored in the second predetermined block through the predetermined pad, and determining whether the first pad is passed.

Abstract translation: 公开了一种能够改善芯片焊盘的测试覆盖范围的方法，其中芯片包括控制单元，多个焊盘和存储单元。 存储单元包括多个块。 该方法包括通过多个焊盘的预定焊盘将测试数据写入第一预定块，控制第一焊盘从第一预定块读取和存储测试数据的预定数据，控制第一焊盘写入预定的 基准到第二预定块，通过预定的焊盘读取存储在第二预定块中的预定数据，并确定第一焊盘是否通过。

公开(公告)号：US09093179B2

公开(公告)日：2015-07-28

申请号：US13865206

申请日：2013-04-18

Applicant: Etron Technology, Inc.

Inventor： Shih-Hsing Wang ,  Ming-Cheng Liang ,  Kuo-Cheng Ting

IPC: G11C29/12 ,  G11C29/02

CPC classification number: G11C29/12 ,  G11C29/022 ,  G11C29/1201

Abstract: A method for improving test coverage of pads of a chip, where the chip includes a control unit, a plurality of pads, and a storage unit, and the storage unit includes a plurality of blocks, includes writing test data to a first predetermined block through a predetermined pad of the plurality of pads, controlling a first pad to read and store a predetermined datum of the test data from the first predetermined block, controlling the first pad to write the predetermined datum to a second predetermined block, reading the predetermined datum stored in the second predetermined block through the predetermined pad, and determining whether the first pad is passed.

Abstract translation: 一种用于提高芯片焊盘测试覆盖范围的方法，其中芯片包括控制单元，多个焊盘和存储单元，并且存储单元包括多个块，包括将测试数据写入第一预定块，通过 多个焊盘中的预定焊盘，控制第一焊盘从第一预定块读取和存储测试数据的预定数据，控制第一焊盘将预定原料写入第二预定块，读取存储的预定数据 在所述第二预定块中通过所述预定焊盘，并且确定所述第一焊盘是否通过。