Process and device for measuring the optical properties of thin layers
    2.
    发明授权
    Process and device for measuring the optical properties of thin layers 失效
    用于测量薄层光学性能的方法和装置

    公开(公告)号:US4878755A

    公开(公告)日:1989-11-07

    申请号:US881708

    申请日:1986-07-03

    摘要: Process for measuring the optical properties of thin layers while they are being built up in vacuum coating installations. For this purpose, at least one test object is passed through a stationary measuring light beam and the transmission behavior of the test object is evaluated by measurement. A reference point for the measurements is fixed in each case by reference measurements at intervals of time. In addition, at least one opaque measurement zone and at least one measuring zone, which does not attenuate the measuring light beam, are disposed in path of motion of the test object. The ratio of the measured value of the test object, decreased by the measured value of the opaque measuring zone, to the measured value of the nonattenuating measuring zone, decreased by the measured value of the opaque measuring zone, is formed by an arithmetic logic unit.

    摘要翻译: 在真空涂层装置中建立薄层的光学性能的测量方法。 为此,至少一个测试对象通过静止的测量光束,并通过测量来评估测试对象的传输行为。 在每种情况下,通过参考测量在时间间隔固定测量的参考点。 此外,至少一个不透明测量区域和至少一个不衰减测量光束的测量区域被设置在测试对象的运动路径中。 通过算术逻辑单元形成测试对象的测量值与不透明测量区域的测量值相比减小到不透明测量区域的测量值的比例, 。