公开(公告)号：US20190265376A1

公开(公告)日：2019-08-29

申请号：US16251255

申请日：2019-01-18

Applicant: ExxonMobil Research and Engineering Company

Inventor： Stefan S. Natu ,  Mehmet D. Ertas ,  Harry W. Deckman

IPC: G01V1/30

Abstract: The present disclosure generally relates to a computer-implemented method for determining intrinsic attenuation in a region of a subsurface. The method generally includes obtaining seismic data around the region of the subsurface; processing the seismic data to obtain a reflectivity spectrum in the region of the subsurface; fitting the reflectivity spectrum to analytic formulas as a function of frequency; and determining the intrinsic attenuation in the region of the subsurface based on the fitting. Other aspects of the present disclosure relate to a computer-implemented method for determining the thickness of a thin subsurface bed at a horizon of interest.

公开(公告)号：US20190242733A1

公开(公告)日：2019-08-08

申请号：US16248973

申请日：2019-01-16

Applicant: ExxonMobil Research and Engineering Company

Inventor： Lang Feng ,  Stefan S. Natu ,  John J. Valenza, II

IPC: G01F1/66 ,  G01N33/28 ,  G01N22/00 ,  G01F1/74

CPC classification number: G01F1/66 ,  G01F1/74 ,  G01N21/85 ,  G01N22/00 ,  G01N33/28 ,  G01N33/2823

Abstract: Methods and apparatus for examining a material are provided. One example method generally includes disposing the material in a dielectric contrast analysis structure, wherein the dielectric contrast analysis structure comprises a bulk dielectric substance and a plurality of receptacles in the bulk dielectric substance, wherein the material is disposed in one or more of the plurality of receptacles; exposing the dielectric contrast analysis structure to incident electromagnetic radiation; detecting resultant radiation from the exposed dielectric contrast analysis structure; and analyzing the detected resultant radiation to estimate at least one of a phase fraction and a phase distribution in the material. One example system generally includes an electromagnetic radiation source; a dielectric contrast analysis structure comprising a bulk dielectric substance and a plurality of receptacles in the bulk dielectric substance for receiving the material; and an electromagnetic radiation detector, wherein the analysis structure is between the radiation source and the detector.