公开(公告)号：US11493481B2

公开(公告)日：2022-11-08

申请号：US16785794

申请日：2020-02-10

Applicant: ExxonMobil Research and Engineering Company

Inventor： John J. Valenza, II

IPC: G01N29/036 ,  G01N29/22 ,  G01N29/24 ,  G01N29/44 ,  G01N29/28

Abstract: Embodiments herein generally relate to systems and methods to determine the composition, properties, and morphology of a liquid in a liquid handling structure. Aspects disclosed include exploiting spatiotemporal constraints of zero-group-velocity modes for non-contact, non-invasive, liquid sensing applications.

公开(公告)号：US20200378926A1

公开(公告)日：2020-12-03

申请号：US16785794

申请日：2020-02-10

Applicant: ExxonMobil Research and Engineering Company

Inventor： John J. Valenza, II

IPC: G01N29/036 ,  G01N29/22 ,  G01N29/24 ,  G01N29/28 ,  G01N29/44

Abstract: Embodiments herein generally relate to systems and methods to determine the composition, properties, and morphology of a liquid in a liquid handling structure. Aspects disclosed include exploiting spatiotemporal constraints of zero-group-velocity modes for non-contact, non-invasive, liquid sensing applications.

公开(公告)号：US20190242733A1

公开(公告)日：2019-08-08

申请号：US16248973

申请日：2019-01-16

Applicant: ExxonMobil Research and Engineering Company

Inventor： Lang Feng ,  Stefan S. Natu ,  John J. Valenza, II

IPC: G01F1/66 ,  G01N33/28 ,  G01N22/00 ,  G01F1/74

CPC classification number: G01F1/66 ,  G01F1/74 ,  G01N21/85 ,  G01N22/00 ,  G01N33/28 ,  G01N33/2823

Abstract: Methods and apparatus for examining a material are provided. One example method generally includes disposing the material in a dielectric contrast analysis structure, wherein the dielectric contrast analysis structure comprises a bulk dielectric substance and a plurality of receptacles in the bulk dielectric substance, wherein the material is disposed in one or more of the plurality of receptacles; exposing the dielectric contrast analysis structure to incident electromagnetic radiation; detecting resultant radiation from the exposed dielectric contrast analysis structure; and analyzing the detected resultant radiation to estimate at least one of a phase fraction and a phase distribution in the material. One example system generally includes an electromagnetic radiation source; a dielectric contrast analysis structure comprising a bulk dielectric substance and a plurality of receptacles in the bulk dielectric substance for receiving the material; and an electromagnetic radiation detector, wherein the analysis structure is between the radiation source and the detector.