公开(公告)号：US20160027631A1

公开(公告)日：2016-01-28

申请号：US14875129

申请日：2015-10-05

Applicant: FUJIFILM CORPORATION

Inventor： Masayuki NAYA ,  Shogo YAMAZOE ,  Megumi SHIOTA ,  Makoto SUEMATSU

IPC: H01J49/16 ,  H01J49/04 ,  G01N21/65

CPC classification number: H01J49/164 ,  G01N21/658 ,  G01N2201/06113 ,  G01N2201/068 ,  H01J49/0004 ,  H01J49/0418 ,  H01J49/40

Abstract: A metal film of a measurement device including a transparent dielectric substrate is irradiated with first light from a transparent dielectric substrate side, an optical electric field enhanced by an optical electric field enhancing effect of a localized plasmon induced to a surface of the metal film by the irradiation is generated, light emitted from the transparent dielectric substrate side is detected, a specimen installed on a surface of a metal fine concavo-convex structure layer and a matrix agent are irradiated with second light from a side opposite to the side of the irradiation with the first light in a state where a voltage is applied to the metal fine concavo-convex structure layer through a voltage application electrode, an analysis target substance for mass spectrometry in the specimen is desorbed from the surface by the irradiation, and the desorbed analysis target substance is detected.

Abstract translation: 用透明电介质基板侧的第一光照射包括透明电介质基板的测量装置的金属膜，通过由金属膜的表面引起的局部等离子体激元的光电场增强效应增强的光电场 产生照射，检测从透明电介质基板侧发出的光，将安装在金属微细凹凸结构层的表面上的试样和基体试剂从与照射侧相反侧的第二光照射， 通过电压施加电极向金属微细凹凸结构层施加电压的状态下的第一光，通过照射将样品中的质谱分析对象物质从表面解吸，解吸分析对象 检测到物质。