公开(公告)号：US20160027631A1

公开(公告)日：2016-01-28

申请号：US14875129

申请日：2015-10-05

Applicant: FUJIFILM CORPORATION

Inventor： Masayuki NAYA ,  Shogo YAMAZOE ,  Megumi SHIOTA ,  Makoto SUEMATSU

IPC: H01J49/16 ,  H01J49/04 ,  G01N21/65

CPC classification number: H01J49/164 ,  G01N21/658 ,  G01N2201/06113 ,  G01N2201/068 ,  H01J49/0004 ,  H01J49/0418 ,  H01J49/40

Abstract: A metal film of a measurement device including a transparent dielectric substrate is irradiated with first light from a transparent dielectric substrate side, an optical electric field enhanced by an optical electric field enhancing effect of a localized plasmon induced to a surface of the metal film by the irradiation is generated, light emitted from the transparent dielectric substrate side is detected, a specimen installed on a surface of a metal fine concavo-convex structure layer and a matrix agent are irradiated with second light from a side opposite to the side of the irradiation with the first light in a state where a voltage is applied to the metal fine concavo-convex structure layer through a voltage application electrode, an analysis target substance for mass spectrometry in the specimen is desorbed from the surface by the irradiation, and the desorbed analysis target substance is detected.

Abstract translation: 用透明电介质基板侧的第一光照射包括透明电介质基板的测量装置的金属膜，通过由金属膜的表面引起的局部等离子体激元的光电场增强效应增强的光电场 产生照射，检测从透明电介质基板侧发出的光，将安装在金属微细凹凸结构层的表面上的试样和基体试剂从与照射侧相反侧的第二光照射， 通过电压施加电极向金属微细凹凸结构层施加电压的状态下的第一光，通过照射将样品中的质谱分析对象物质从表面解吸，解吸分析对象 检测到物质。

公开(公告)号：US20150198535A1

公开(公告)日：2015-07-16

申请号：US14668500

申请日：2015-03-25

Applicant: FUJIFILM Corporation

Inventor： Shogo YAMAZOE ,  Masayuki NAYA ,  Megumi SHIOTA

IPC: G01N21/65 ,  G01J3/44 ,  G01J3/02 ,  G01B11/14

CPC classification number: G01N21/658 ,  G01B11/14 ,  G01J3/0227 ,  G01J3/4412 ,  G01N2201/0612

Abstract: Using an optical electric field enhancing device including a fine uneven structure made of gold formed on the front surface of a transparent substrate, illumination light of a wavelength in the range from 400 to 530 nm is applied at least to an analyte, positional information of the analyte is detected by a position detection unit disposed on the rear surface side of the optical electric field enhancing device, and excitation light is applied to the detected position by an excitation light application unit. Signal light emitted from the analyte when the excitation light is applied is detected from the rear surface side of the transparent substrate.

Abstract translation: 使用包含形成在透明基板的前表面上的由金制成的精细不均匀结构的光电场增强装置，至少将至少对被分析物施加400〜530nm波长的照明光，将位置信息 通过设置在光电场增强装置的后表面侧的位置检测单元来检测分析物，并且通过激发光施加单元将激发光施加到检测位置。 从透明基板的背面侧检测施加激发光时从分析物发出的信号光。