公开(公告)号：US20190383857A1

公开(公告)日：2019-12-19

申请号：US16440468

申请日：2019-06-13

Applicant: FormFactor, Inc.

Inventor： January Kister ,  Roy Swart ,  Edin Sijercic

IPC: G01R1/067

Abstract: Probes for testing electrical circuits having decoupled electrical and mechanical design are provided. For example, a mechanically resilient core can be surrounded by an electrically conductive shell. In this way, electrical parameters of the probes are determined by the shells and mechanical parameters of the probes are determined by the cores. An important application of this approach is to provide impedance matched transmission line probes.

公开(公告)号：US11156637B2

公开(公告)日：2021-10-26

申请号：US16440468

申请日：2019-06-13

Applicant: FormFactor, Inc.

Inventor： January Kister ,  Roy Swart ,  Edin Sijercic

IPC: G01R1/067

Abstract: Probes for testing electrical circuits having decoupled electrical and mechanical design are provided. For example, a mechanically resilient core can be surrounded by an electrically conductive shell. In this way, electrical parameters of the probes are determined by the shells and mechanical parameters of the probes are determined by the cores. An important application of this approach is to provide impedance matched transmission line probes.

公开(公告)号：US12113583B2

公开(公告)日：2024-10-08

申请号：US17143850

申请日：2021-01-07

Applicant: FormFactor, Inc.

Inventor： Dennis Rosenauer ,  Roger Hayward ,  Roy Swart

IPC: H04B17/12 ,  H04B17/16 ,  H04B17/19 ,  H04B7/06

CPC classification number: H04B17/12 ,  H04B17/16 ,  H04B17/19 ,  H04B7/0617

Abstract: Improved electrical testing of N-port beamforming devices is provided. For testing, an N:1 electrical network is connected to the N ports of the device under test to provide a single test port. This mode of testing can be used to determine parameters of interest (e.g., far field radiation patterns etc.) of the device under test more rapidly than with antenna range testing or with characterization of each port of the device under test. The N:1 electrical network can be passive or active. The N:1 electrical network can be integrated in a probe head to provide probe array testing of beamforming devices. Alternatively, the N:1 electrical network can be integrated with the device under test to provide onboard testing capability.

公开(公告)号：US20210211210A1

公开(公告)日：2021-07-08

申请号：US17143850

申请日：2021-01-07

Applicant: FormFactor, Inc.

Inventor： Dennis Rosenauer ,  Roger Hayward ,  Roy Swart

IPC: H04B17/12 ,  H04B17/16 ,  H04B17/19

Abstract: Improved electrical testing of N-port beamforming devices is provided. For testing, an N:1 electrical network is connected to the N ports of the device under test to provide a single test port. This mode of testing can be used to determine parameters of interest (e.g., far field radiation patterns etc.) of the device under test more rapidly than with antenna range testing or with characterization of each port of the device under test. The N:1 electrical network can be passive or active. The N:1 electrical network can be integrated in a probe head to provide probe array testing of beamforming devices. Alternatively, the N:1 electrical network can be integrated with the device under test to provide onboard testing capability.