公开(公告)号：US07010735B2

公开(公告)日：2006-03-07

申请号：US10043486

申请日：2002-01-10

申请人： Franco Motika ,  Philip J. Nigh ,  Peilin Song

发明人： Franco Motika ,  Philip J. Nigh ,  Peilin Song

IPC分类号： G01R31/28

CPC分类号： G11C29/025 ,  G01R31/318342 ,  G11C29/02 ,  G11C29/32

摘要： While data cannot be transmitted down a scan chain through a stuck-at fault location, data in properly operating latches downstream of the stuck-at fault location can be shifted down the chain. By varying operating parameters, such as power supply and reference voltages, clock timing patterns, temperature and timing sequences, one or more latches down the SRL chain from the stuck-at fault location may be triggered to change state from the stuck-at fault value. The SRL chain is then operated to shift data out the output of the SRL chain. The output is monitored and any change in value from the stuck-at state is noted as identifying all good latch positions to end of the chain. The process is repeated: varying each of the selected operating parameters until the latch position following the stuck-at fault latch is identified.

摘要翻译： 虽然数据不能通过卡住的故障位置沿扫描链传输，但在卡住故障位置下游的正确操作的锁存器中的数据可以向下移动。 通过改变操作参数，例如电源和参考电压，时钟时序模式，温度和时序，可以触发从链路故障位置向下链接的一个或多个锁存器，以将状态从卡入故障值 。 然后运行SRL链将数据移出SRL链的输出。 输出被监视，并且从卡入状态的值的任何变化被注意为将所有良好的锁定位置识别到链的末端。 重复该过程：改变所选择的每个操作参数，直到识别出卡入故障锁存之后的锁存位置。