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    USE OF AN AMORPHOUS SILICON LAYER AND ANALYSIS METHODS
    1.
    发明申请
    USE OF AN AMORPHOUS SILICON LAYER AND ANALYSIS METHODS 审中-公开
    使用非晶硅层和分析方法

    公开(公告)号：US20120142045A1

    公开(公告)日：2012-06-07

    申请号：US13376057

    申请日：2010-06-04

    申请人： Francois Ozanam ,  Larbi Touahir ,  Elisabeth Galopin ,  Rabah Boukherroub ,  Jean-Noel Chazalviel ,  Anne Chantal Gouget ,  Sabine Szunerits

    发明人： Francois Ozanam ,  Larbi Touahir ,  Elisabeth Galopin ,  Rabah Boukherroub ,  Jean-Noel Chazalviel ,  Anne Chantal Gouget ,  Sabine Szunerits

    IPC分类号： G01N21/64 ,  G01N21/55

    CPC分类号： G01N21/6428 ,  G01N21/553 ,  G01N21/648

    摘要： A method of detecting substances or reactions of substances in a sample, comprising: (i) providing a layer (CS) based on hydrogenated or unhydrogenated amorphous silicon with attached probes, (ii) bringing the layer (CS) in contact with the sample that may contain the substances that bind specifically to or reacts specifically with the probes, under appropriate conditions for the substances to bind to or react with the probes; (iii) optionally removing non-specifically bound or non-specifically reactive substances; and (iv) detecting the presence or amount of the specifically bound or reactive substances in the sample by surface plasmon resonance (SPR) and/or fluorescence, is described.

    摘要翻译： 一种检测样品中物质或物质反应的方法，包括：（i）提供基于氢化或非氢化非晶硅的附着探针的层（CS），（ii）使层（CS）与样品接触 可能含有与探针结合或与探针结合或反应的适当条件下特异性结合或与探针特异性结合的物质; （iii）任选地除去非特异性结合或非特异性反应物质; 和（iv）通过表面等离子体共振（SPR）和/或荧光来检测样品中特异性结合或反应物质的存在或量。