ON-CHIP DETECTION OF POWER SUPPLY VULNERABILITIES
    1.
    发明申请
    ON-CHIP DETECTION OF POWER SUPPLY VULNERABILITIES 有权
    电源漏电检测

    公开(公告)号:US20100109700A1

    公开(公告)日:2010-05-06

    申请号:US12684142

    申请日:2010-01-08

    IPC分类号: G01R31/36

    摘要: On-chip sensor to detect power supply vulnerabilities. The on-chip sensor employs a sensitive delay chain and an insensitive delay chain to detect power supply undershoots and overshoots without requiring external off-chip components. Undershoots and overshoots outside a user-defined threshold are detected. The undershoots and overshoots are indicated by a relative difference in phase of the two delay chains. The two delay chains are programmable to detect various frequencies.

    摘要翻译: 片上传感器检测电源漏洞。 片内传感器采用敏感延迟链和不敏感延迟链,以检测电源下冲和过冲,而无需外部片外部件。 检测到用户定义的阈值之外的下冲和超调。 下冲和过冲由两个延迟链的相位相对差异表示。 两个延迟链可编程,以检测各种频率。

    ON-CHIP DETECTION OF POWER SUPPLY VULNERABILITIES
    2.
    发明申请
    ON-CHIP DETECTION OF POWER SUPPLY VULNERABILITIES 有权
    电源漏电检测

    公开(公告)号:US20080129325A1

    公开(公告)日:2008-06-05

    申请号:US12013833

    申请日:2008-01-14

    IPC分类号: G01R31/26

    摘要: On-chip sensor to detect power supply vulnerabilities. The on-chip sensor employs a sensitive delay chain and an insensitive delay chain to detect power supply undershoots and overshoots without requiring external off-chip components. Undershoots and overshoots outside a user-defined threshold are detected. The undershoots and overshoots are indicated by a relative difference in phase of the two delay chains. The two delay chains are programmable to detect various frequencies.

    摘要翻译: 片上传感器检测电源漏洞。 片内传感器采用敏感延迟链和不敏感延迟链,以检测电源下冲和过冲,而无需外部片外部件。 检测到用户定义的阈值之外的下冲和超调。 下冲和过冲由两个延迟链的相位相对差异表示。 两个延迟链可编程,以检测各种频率。

    On-chip detection of power supply vulnerabilities
    3.
    发明授权
    On-chip detection of power supply vulnerabilities 有权
    片上检测电源漏洞

    公开(公告)号:US07952370B2

    公开(公告)日:2011-05-31

    申请号:US12684142

    申请日:2010-01-08

    IPC分类号: G01R31/40 G01R31/3187

    摘要: On-chip sensor to detect power supply vulnerabilities. The on-chip sensor employs a sensitive delay chain and an insensitive delay chain to detect power supply undershoots and overshoots without requiring external off-chip components. Undershoots and overshoots outside a user-defined threshold are detected. The undershoots and overshoots are indicated by a relative difference in phase of the two delay chains. The two delay chains are programmable to detect various frequencies.

    摘要翻译: 片上传感器检测电源漏洞。 片内传感器采用敏感延迟链和不敏感延迟链,以检测电源下冲和过冲,而无需外部片外部件。 检测到用户定义的阈值之外的下冲和超调。 下冲和过冲由两个延迟链的相位相对差异表示。 两个延迟链可编程,以检测各种频率。

    On-chip detection of power supply vulnerabilities
    4.
    发明授权
    On-chip detection of power supply vulnerabilities 有权
    片上检测电源漏洞

    公开(公告)号:US07646208B2

    公开(公告)日:2010-01-12

    申请号:US12013833

    申请日:2008-01-14

    IPC分类号: G01R31/36 G01R31/28 H01L23/58

    摘要: On-chip sensor to detect power supply vulnerabilities. The on-chip sensor employs a sensitive delay chain and an insensitive delay chain to detect power supply undershoots and overshoots without requiring external off-chip components. Undershoots and overshoots outside a user-defined threshold are detected. The undershoots and overshoots are indicated by a relative difference in phase of the two delay chains. The two delay chains are programmable to detect various frequencies.

    摘要翻译: 片上传感器检测电源漏洞。 片内传感器采用敏感延迟链和不敏感延迟链,以检测电源下冲和过冲,而无需外部片外部件。 检测到用户定义的阈值之外的下冲和超调。 下冲和过冲由两个延迟链的相位相对差异表示。 两个延迟链可编程,以检测各种频率。

    On-chip detection of power supply vulnerabilities
    5.
    发明授权
    On-chip detection of power supply vulnerabilities 有权
    片上检测电源漏洞

    公开(公告)号:US07355435B2

    公开(公告)日:2008-04-08

    申请号:US11056822

    申请日:2005-02-10

    IPC分类号: G01R31/36 G01R31/28 H01L23/58

    摘要: On-chip sensor to detect power supply vulnerabilities. The on-chip sensor employs a sensitive delay chain and an insensitive delay chain to detect power supply undershoots and overshoots without requiring external off-chip components. Undershoots and overshoots outside a user-defined threshold are detected. The undershoots and overshoots are indicated by a relative difference in phase of the two delay chains. The two delay chains are programmable to detect various frequencies.

    摘要翻译: 片上传感器检测电源漏洞。 片内传感器采用敏感延迟链和不敏感延迟链,以检测电源下冲和过冲,而无需外部片外部件。 检测到用户定义的阈值之外的下冲和超调。 下冲和过冲由两个延迟链的相位相对差异表示。 两个延迟链可编程,以检测各种频率。

    On-chip power supply noise detector
    6.
    发明申请
    On-chip power supply noise detector 失效
    片上电源噪声检测器

    公开(公告)号:US20060214672A1

    公开(公告)日:2006-09-28

    申请号:US11089215

    申请日:2005-03-24

    IPC分类号: G01R27/08

    CPC分类号: G01R31/3004 G01R19/16552

    摘要: Techniques for on-chip detection of integrated circuit power supply noise are disclosed. By way of example, a technique for monitoring a power supply line in an integrated circuit comprises the following steps/operations. A first signal and a second signal are preconditioned. The first signal is representative of a voltage of the power supply line being monitored. The second signal is representative of a voltage of a reference power supply line. Preconditioning comprises shifting respective levels of the voltages such that the voltages are within an input voltage range of comparator circuitry. Then, the preconditioned first signal and the preconditioned second signal are compared in accordance with the comparator circuitry. Comparison comprises detecting when a difference exists between the voltage level of the preconditioned first signal and the voltage level of the preconditioned second signal.

    摘要翻译: 公开了片上检测集成电路电源噪声的技术。 作为示例,用于监视集成电路中的电源线的技术包括以下步骤/操作。 第一信号和第二信号被预处理。 第一信号代表被监测的电源线的电压。 第二信号代表参考电源线的电压。 预处理包括使电压的各个电平移动,使得电压在比较器电路的输入电压范围内。 然后,根据比较器电路对预处理的第一信号和预处理的第二信号进行比较。 比较包括检测预处理的第一信号的电压电平与预处理的第二信号的电压电平之间的差异。

    On-chip power supply noise detector
    8.
    发明授权
    On-chip power supply noise detector 失效
    片上电源噪声检测器

    公开(公告)号:US07443187B2

    公开(公告)日:2008-10-28

    申请号:US11874528

    申请日:2007-10-18

    IPC分类号: G01R31/02

    CPC分类号: G01R31/3004 G01R19/16552

    摘要: Techniques for on-chip detection of integrated circuit power supply noise are disclosed. By way of example, a technique for monitoring a power supply line in an integrated circuit includes the following steps/operations. A first signal and a second signal are preconditioned. The first signal is representative of a voltage of the power supply line being monitored. The second signal is representative of a voltage of a reference power supply line. Preconditioning includes shifting respective levels of the voltages such that the voltages are within an input voltage range of comparator circuitry. Then, the preconditioned first signal and the preconditioned second signal are compared in accordance with the comparator circuitry. Comparison includes detecting when a difference exists between the voltage level of the preconditioned first signal and the voltage level of the preconditioned second signal.

    摘要翻译: 公开了片上检测集成电路电源噪声的技术。 作为示例,用于监视集成电路中的电源线的技术包括以下步骤/操作。 第一信号和第二信号被预处理。 第一信号代表被监测的电源线的电压。 第二信号代表参考电源线的电压。 预处理包括移动电压的各个电平,使得电压在比较器电路的输入电压范围内。 然后,根据比较器电路对预处理的第一信号和预处理的第二信号进行比较。 比较包括检测预处理的第一信号的电压电平与预处理的第二信号的电压电平之间的差异。

    On-Chip Power Supply Noise Detector
    9.
    发明申请
    On-Chip Power Supply Noise Detector 审中-公开
    片上电源噪声检测器

    公开(公告)号:US20080258751A1

    公开(公告)日:2008-10-23

    申请号:US12166847

    申请日:2008-07-02

    IPC分类号: G01R31/02

    CPC分类号: G01R31/3004 G01R19/16552

    摘要: Techniques for on-chip detection of integrated circuit power supply noise are disclosed. By way of example, a technique for monitoring a power supply line in an integrated circuit includes the following steps/operations. A first signal and a second signal are preconditioned. The first signal is representative of a voltage of the power supply line being monitored. The second signal is representative of a voltage of a reference power supply line. Preconditioning includes shifting respective levels of the voltages such that the voltages are within an input voltage range of comparator circuitry. Then, the preconditioned first signal and the preconditioned second signal are compared in accordance with the comparator circuitry. Comparison includes detecting when a difference exists between the voltage level of the preconditioned first signal and the voltage level of the preconditioned second signal.

    摘要翻译: 公开了片上检测集成电路电源噪声的技术。 作为示例,用于监视集成电路中的电源线的技术包括以下步骤/操作。 第一信号和第二信号被预处理。 第一信号代表被监测的电源线的电压。 第二信号代表参考电源线的电压。 预处理包括移动电压的各个电平,使得电压在比较器电路的输入电压范围内。 然后,根据比较器电路对预处理的第一信号和预处理的第二信号进行比较。 比较包括检测预处理的第一信号的电压电平与预处理的第二信号的电压电平之间的差异。

    On-chip power supply noise detector
    10.
    发明授权
    On-chip power supply noise detector 失效
    片上电源噪声检测器

    公开(公告)号:US07355429B2

    公开(公告)日:2008-04-08

    申请号:US11089215

    申请日:2005-03-24

    IPC分类号: G01R31/02

    CPC分类号: G01R31/3004 G01R19/16552

    摘要: Techniques for on-chip detection of integrated circuit power supply noise are disclosed. By way of example, a technique for monitoring a power supply line in an integrated circuit includes the following steps/operations. A first signal and a second signal are preconditioned. The first signal is representative of a voltage of the power supply line being monitored. The second signal is representative of a voltage of a reference power supply line. Preconditioning includes shifting respective levels of the voltages such that the voltages are within an output voltage range of comparator circuitry. Then, the preconditioned first signal and the preconditioned second signal are compared in accordance with the comparator circuitry. Comparison includes detecting when a difference exists between the voltage level of the preconditioned first signal and the voltage level of the preconditioned second signal.

    摘要翻译: 公开了片上检测集成电路电源噪声的技术。 作为示例,用于监视集成电路中的电源线的技术包括以下步骤/操作。 第一信号和第二信号被预处理。 第一信号代表被监测的电源线的电压。 第二信号代表参考电源线的电压。 预处理包括移动电压的各个电平,使得电压在比较器电路的输出电压范围内。 然后,根据比较器电路对预处理的第一信号和预处理的第二信号进行比较。 比较包括检测预处理的第一信号的电压电平与预处理的第二信号的电压电平之间的差异。