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公开(公告)号：US07177777B2
公开(公告)日：2007-02-13
申请号：US11000791
申请日：2004-12-01
IPC分类号： G06F11/00
CPC分类号： G01R31/3016 , G01R31/31726 , G01R31/31937
摘要： A test apparatus has multiple instruments that are synchronized with respect to one another so that a trigger signal may be generated in response to events occurring at different instruments. The events may correspond to events defined within a test program or events detected at a device under test. A partial trigger signal is generated by each of the different instruments, and the partial trigger signals are used in generating the trigger signal. Different offset delays are applied to the partial trigger signals so that the partial trigger signals generated by the different instruments are synchronized with respect to each other.
摘要翻译： 测试装置具有相对于彼此同步的多个仪器，使得可以响应于在不同仪器处发生的事件而产生触发信号。 事件可能对应于在测试程序中定义的事件或在被测设备上检测到的事件。 部分触发信号由各种不同的仪器产生，部分触发信号用于产生触发信号。 不同的偏移延迟被施加到部分触发信号，使得由不同仪器产生的部分触发信号相对于彼此同步。
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公开(公告)号：US20060085157A1
公开(公告)日：2006-04-20
申请号：US11000791
申请日：2004-12-01
IPC分类号： G06F19/00
CPC分类号： G01R31/3016 , G01R31/31726 , G01R31/31937
摘要： A test apparatus has multiple instruments that are synchronized with respect to one another so that a trigger signal may be generated in response to events occurring at different instruments. The events may correspond to events defined within a test program or events detected at a device under test. A partial trigger signal is generated by each of the different instruments, and the partial trigger signals are used in generating the trigger signal. Different offset delays are applied to the partial trigger signals so that the partial trigger signals generated by the different instruments are synchronized with respect to each other.
摘要翻译： 测试装置具有相对于彼此同步的多个仪器，使得可以响应于在不同仪器处发生的事件而产生触发信号。 事件可能对应于在测试程序中定义的事件或在被测设备上检测到的事件。 部分触发信号由各种不同的仪器产生，部分触发信号用于产生触发信号。 不同的偏移延迟被施加到部分触发信号，使得由不同仪器产生的部分触发信号相对于彼此同步。
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公开(公告)号：US20060074584A1
公开(公告)日：2006-04-06
申请号：US10956549
申请日：2004-10-01
IPC分类号： G06F19/00
CPC分类号： G01R31/3016 , G01R31/31726 , G01R31/31937
摘要： A test apparatus has multiple instruments that are synchronized with respect to one another so that test data generated by them arrive at the pins of a device under test at the time specified in a test program. The synchronization of the multiple instruments is carried out by introducing delays to triggers that are generated and used by the multiple instruments. The amount of delay that is introduced varies from instrument to instrument and is based on differences in the actual transmission and processing delays and clock rates.
摘要翻译： 测试装置具有相对于彼此同步的多个仪器，使得它们产生的测试数据在测试程序中指定的时间到达被测器件的引脚。 多个仪器的同步是通过引入由多个仪器生成和使用的触发器的延迟来执行的。 引入的延迟量因仪器而异，并且基于实际传输和处理延迟和时钟速率的差异。
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公开(公告)号：US07099792B2
公开(公告)日：2006-08-29
申请号：US10956549
申请日：2004-10-01
CPC分类号： G01R31/3016 , G01R31/31726 , G01R31/31937
摘要： A test apparatus has multiple instruments that are synchronized with respect to one another so that test data generated by them arrive at the pins of a device under test at the time specified in a test program. The synchronization of the multiple instruments is carried out by introducing delays to triggers that are generated and used by the multiple instruments. The amount of delay that is introduced varies from instrument to instrument and is based on differences in the actual transmission and processing delays and clock rates.
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公开(公告)号：US20050102592A1
公开(公告)日：2005-05-12
申请号：US11021965
申请日：2004-12-21
申请人： Michael Jones , Frederic Giral , William Fritzsche
发明人： Michael Jones , Frederic Giral , William Fritzsche
IPC分类号： G01R31/319 , G01R31/28
CPC分类号： G01R31/31907 , G01R31/31922
摘要： Method and apparatus for circuit testing with ring-connected test instrument modules. A system for controlling one or more test instruments to test one or more integrated circuits includes a master clock and a controller. The test instruments are connected to form a communication ring. The master clock is connected to each test instrument and provides a clock signal to the one or more test instruments. The controller is connected to the communication ring and is configured to align counters of test instruments to derive a common clock time value from the clock signal. The controller is further configured to generate and send data words into the communication ring to carry the data words to each test instrument. The data words includes at least one data word specifying a test event to be performed, a common clock time value, and at least one of the test instruments.
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公开(公告)号：US07043390B2
公开(公告)日：2006-05-09
申请号：US11021965
申请日：2004-12-21
IPC分类号： G06F3/05
CPC分类号： G01R31/31907 , G01R31/31922
摘要： Method and apparatus for circuit testing with ring-connected test instrument modules. A system for controlling one or more test instruments to test one or more integrated circuits includes a master clock and a controller. The test instruments are connected to form a communication ring. The master clock is connected to each test instrument and provides a clock signal to the one or more test instruments. The controller is connected to the communication ring and is configured to align counters of test instruments to derive a common clock time value from the clock signal. The controller is further configured to generate and send data words into the communication ring to carry the data words to each test instrument. The data words includes at least one data word specifying a test event to be performed, a common clock time value, and at least one of the test instruments.
摘要翻译： 使用环形测试仪器模块进行电路测试的方法和装置。 用于控制一个或多个测试仪器以测试一个或多个集成电路的系统包括主时钟和控制器。 测试仪器连接形成一个通讯环。 主时钟连接到每个测试仪器，并向一个或多个测试仪器提供时钟信号。 控制器连接到通信环，并配置为对准测试仪器的计数器，以从时钟信号中导出公共时钟时间值。 该控制器还被配置为产生数据字并将其发送到通信环中，以将数据字携带到每个测试仪器。 数据字包括指定要执行的测试事件，公共时钟时间值和至少一个测试仪器的至少一个数据字。
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公开(公告)号：US20050149800A1
公开(公告)日：2005-07-07
申请号：US11049119
申请日：2005-02-01
申请人： Michael Jones , Frederic Giral , William Fritzsche
发明人： Michael Jones , Frederic Giral , William Fritzsche
IPC分类号： G01R31/319 , G01R31/28
CPC分类号： G01R31/31907 , G01R31/31922
摘要： Method and apparatus for circuit testing with ring-connected test instrument modules. A system for controlling one or more test instruments to test one or more integrated circuits includes a master clock and a controller. The test instruments are connected to form a communication ring. The master clock is connected to each test instrument and provides a clock signal to the one or more test instruments. The controller is connected to the communication ring and is configured to align counters of test instruments to derive a common clock time value from the clock signal. The controller is further configured to generate and send data words into the communication ring to carry the data words to each test instrument. The data words includes at least one data word specifying a test event to be performed, a common clock time value, and at least one of the test instruments.
摘要翻译： 使用环形测试仪器模块进行电路测试的方法和装置。 用于控制一个或多个测试仪器以测试一个或多个集成电路的系统包括主时钟和控制器。 测试仪器连接形成一个通讯环。 主时钟连接到每个测试仪器，并向一个或多个测试仪器提供时钟信号。 控制器连接到通信环，并配置为对准测试仪器的计数器，以从时钟信号中导出公共时钟时间值。 该控制器还被配置为产生数据字并将其发送到通信环中，以将数据字携带到每个测试仪器。 数据字包括指定要执行的测试事件，公共时钟时间值和至少一个测试仪器的至少一个数据字。
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