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公开(公告)号：US09389260B2
公开(公告)日：2016-07-12
申请号：US13630939
申请日：2012-09-28
Applicant: General Electric Company
Inventor： Radislav Alexandrovich Potyrailo , Jeffrey Michael Ashe , Sm Shajed Hasan , Naresh Kesavan Rao , Krishnakumar Sundaresan
CPC classification number: G01R27/28 , G01R31/2824
Abstract: An impedance analyzer is provided. The analyzer includes a signal excitation generator comprising a digital to analog converter, where a transfer function of the digital to analog converter from digital to analog is programmable. The impedance analyzer further includes a receiver comprising a low noise amplifier (LNA) and an analog to digital converter (ADC), where the LNA is a current to voltage converter; where the programmable digital to analog transfer function is implemented by a direct digital synthesizer (DDS) and a voltage mode digital to analog converter, or a digital phase locked loop (PLL), or both. Further, a multivariable sensor node having an impedance analyzer is provided. Furthermore, a multivariable sensor network having a plurality of multivariable sensor nodes is provided.
Abstract translation: 提供阻抗分析仪。 该分析器包括一个包括数模转换器的信号激励发生器，其中从数字到模拟的数模转换器的传递函数是可编程的。 该阻抗分析器还包括一个包括低噪声放大器（LNA）和模数转换器（ADC）的接收器，其中LNA是电流到电压转换器; 其中可编程数字到模拟传递功能由直接数字合成器（DDS）和电压模式数模转换器或数字锁相环（PLL）或两者实现。 此外，提供了具有阻抗分析器的多变量传感器节点。 此外，提供了具有多个多变量传感器节点的多变量传感器网络。
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公开(公告)号：US09147144B2
公开(公告)日：2015-09-29
申请号：US13630954
申请日：2012-09-28
Applicant: General Electric Company
Inventor： Radislav Alexandrovich Potyrailo , Jeffrey Michael Ashe , Sm Shajed Hasan , Naresh Kesavan Rao , Krishnakumar Sundaresan
IPC: G01N27/00 , G06K19/07 , G06K19/077
CPC classification number: G06K19/0717 , G06K19/0723 , G06K19/07749
Abstract: A method for multivariable measurements using a single-chip impedance analyzer includes providing a sensor, exposing the sensor to an environmental parameter, determining a complex impedance of the sensor over a measured spectral frequency range of the sensor, and monitoring at least three spectral parameters of the sensor.
Abstract translation: 使用单芯片阻抗分析仪进行多变量测量的方法包括提供传感器，将传感器暴露于环境参数，在传感器的测量光谱频率范围内确定传感器的复阻抗，以及监测至少三个光谱参数 传感器。
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公开(公告)号：US20140095102A1
公开(公告)日：2014-04-03
申请号：US13630939
申请日：2012-09-28
Applicant: GENERAL ELECTRIC COMPANY
Inventor： Radislav Alexandrovich Potyrailo , Jeffrey Michael Ashe , Sm Shajed Hasan , Naresh Kesavan Rao , Krishnakumar Sundaresan
CPC classification number: G01R27/28 , G01R31/2824
Abstract: An impedance analyzer is provided. The analyzer includes a signal excitation generator comprising a digital to analog converter, where a transfer function of the digital to analog converter from digital to analog is programmable. The impedance analyzer further includes a receiver comprising a low noise amplifier (LNA) and an analog to digital converter (ADC), where the LNA is a current to voltage converter; where the programmable digital to analog transfer function is implemented by a direct digital synthesizer (DDS) and a voltage mode digital to analog converter, or a digital phase locked loop (PLL), or both. Further, a multivariable sensor node having an impedance analyzer is provided. Furthermore, a multivariable sensor network having a plurality of multivariable sensor nodes is provided.
Abstract translation: 提供阻抗分析仪。 该分析器包括一个包括数模转换器的信号激励发生器，其中从数字到模拟的数模转换器的传递函数是可编程的。 该阻抗分析器还包括一个包括低噪声放大器（LNA）和模数转换器（ADC）的接收器，其中LNA是电流到电压转换器; 其中可编程数字到模拟传递功能由直接数字合成器（DDS）和电压模式数模转换器或数字锁相环（PLL）或两者实现。 此外，提供了具有阻抗分析器的多变量传感器节点。 此外，提供了具有多个多变量传感器节点的多变量传感器网络。
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公开(公告)号：US20140091811A1
公开(公告)日：2014-04-03
申请号：US13630954
申请日：2012-09-28
Applicant: GENERAL ELECTRIC COMPANY
Inventor： Radislav Alexandrovich Potyrailo , Jeffrey Michael Ashe , Sm Shajed Hasan , Naresh Kesavan Rao , Krishnakumar Sundaresan
IPC: G01R27/02
CPC classification number: G06K19/0717 , G06K19/0723 , G06K19/07749
Abstract: A method for multivariable measurements using a single-chip impedance analyzer includes providing a sensor, exposing the sensor to an environmental parameter, determining a complex impedance of the sensor over a measured spectral frequency range of the sensor, and monitoring at least three spectral parameters of the sensor.
Abstract translation: 使用单芯片阻抗分析仪进行多变量测量的方法包括提供传感器，将传感器暴露于环境参数，在传感器的测量光谱频率范围内确定传感器的复阻抗，以及监测至少三个光谱参数 传感器。
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