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公开(公告)号:US20200147889A1
公开(公告)日:2020-05-14
申请号:US16184481
申请日:2018-11-08
Applicant: General Electric Company
Inventor: Voramon Supatarawanich DHEERADHADA , Natarajan CHENNIMALAI KUMAR , Vipul Kumar GUPTA , Laura DIAL , Anthony Joseph VINCIQUERRA , Timothy HANLON
IPC: B29C64/393 , B29C64/10 , G06F17/50 , G06K9/62 , G06N20/00
Abstract: Methods and systems for optimizing additive process parameters for an additive manufacturing process. In some embodiments, the process includes receiving initial additive process parameters, generating an uninformed design of experiment utilizing a specified sampling protocol, next generating, based on the uninformed design of experiment, response data, and then generating, based on the response data and on previous design of experiment that includes at least one of the uninformed design of experiment and informed design of experiment, an informed design of experiment by using the machine learning model and the intelligent sampling protocol. The last process step is repeated until a specified objective is reached or satisfied.
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公开(公告)号:US20170306451A1
公开(公告)日:2017-10-26
申请号:US15138286
申请日:2016-04-26
Applicant: GENERAL ELECTRIC COMPANY
Inventor: Voramon Supatarawanich DHEERADHADA , Don Mark LIPKIN , Akane SUZUKI
CPC classification number: C22C19/058 , B32B15/01 , B32B15/043 , B32B2603/00 , C22C19/007 , C22C19/055 , C23C30/00 , Y02T50/6765
Abstract: Provided is a nickel-based coating composition containing cobalt, chromium, aluminum, tantalum, and nickel. The coating composition has a three phase γ, γ′, β microstructure wherein at least 5 volume % of the coating composition is present in the β phase. Also provided are coating systems containing the coating composition, articles having the coating composition or coating system, and methods for protecting nickel-based superalloy substrates using the coating composition or coating system.
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3.
公开(公告)号:US20230029806A1
公开(公告)日:2023-02-02
申请号:US17967391
申请日:2022-10-17
Applicant: General Electric Company
Inventor: Vipul Kumar GUPTA , Natarajan CHENNIMALAI KUMAR , Anthony Joseph VINCIQUERRA , Laura Cerully DIAL , Voramon Supatarawanich DHEERADHADA , Timothy HANLON , Lembit SALASOO , Xiaohu PING , Subhrajit ROYCHOWDHURY , Justin John GAMBONE
IPC: B29C64/393 , B22F10/20 , B29C64/153 , B22F10/30 , B22F3/24 , B33Y30/00 , B33Y10/00 , B33Y50/02 , B33Y40/00
Abstract: According to some embodiments, system and methods are provided comprising receiving, via a communication interface of a parameter development module comprising a processor, a defined geometry for one or more parts, wherein the parts are manufactured with an additive manufacturing machine, and wherein a stack is formed from one or more parts; fabricating the one or more parts with the additive manufacturing machine based on a first parameter set; collecting in-situ monitoring data from one or more in-situ monitoring systems of the additive manufacturing machine for one or more parts; determining whether each stack should receive an additional part based on an analysis of the collected in-situ monitoring data; and fabricating each additional part based on the determination the stack should receive the additional part. Numerous other aspects are provided.
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4.
公开(公告)号:US20200298499A1
公开(公告)日:2020-09-24
申请号:US16360180
申请日:2019-03-21
Applicant: General Electric Company
Inventor: Vipul Kumar GUPTA , Natarajan CHENNIMALAI KUMAR , Anthony Joseph VINCIQUERRA , Laura Cerully DIAL , Voramon Supatarawanich DHEERADHADA , Timothy HANLON , Lembit SALASOO , Xiaohu PING , Subhrajit ROYCHOWDHURY , Justin John GAMBONE
IPC: B29C64/393 , B22F3/105 , B29C64/153
Abstract: According to some embodiments, system and methods are provided comprising receiving, via a communication interface of a parameter development module comprising a processor, a defined geometry for one or more parts, wherein the parts are manufactured with an additive manufacturing machine, and wherein a stack is formed from one or more parts; fabricating the one or more parts with the additive manufacturing machine based on a first parameter set; collecting in-situ monitoring data from one or more in-situ monitoring systems of the additive manufacturing machine for one or more parts; determining whether each stack should receive an additional part based on an analysis of the collected in-situ monitoring data; and fabricating each additional part based on the determination the stack should receive the additional part. Numerous other aspects are provided.
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