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公开(公告)号:US11586032B2
公开(公告)日:2023-02-21
申请号:US16435986
申请日:2019-06-10
Applicant: Gigaphoton Inc.
Inventor: Hiroyuki Ito , Hiroshi Tanaka
IPC: H05G2/00 , H01S3/00 , G02B26/08 , G02B27/10 , G02B27/14 , H01S3/223 , H01S3/23 , H01S3/10 , B23K26/00
Abstract: A laser apparatus may include: a mirror configured to reflect a laser beam; an actuator configured to operate the mirror; and a controller configured to transmit a movement instruction to the actuator, wherein the controller predicts a movement completion time of the actuator, and transmits a polling signal so that the actuator receives the polling signal after expiration of the predicted movement completion time.
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公开(公告)号:US09622332B2
公开(公告)日:2017-04-11
申请号:US14061295
申请日:2013-10-23
Applicant: GIGAPHOTON INC.
Inventor: Toru Suzuki , Hiroshi Tanaka , Hideyuki Hayashi , Osamu Wakabayashi
CPC classification number: H05G2/008 , G06T7/20 , G06T7/246 , G06T2207/30241 , H05G2/003 , H05G2/006
Abstract: In an extreme ultraviolet light generation apparatus, a target detection section may include a light source, a transfer optical system, an image sensor configured to output image data of an image that has been formed by irradiating a target outputted from a target supply device with light outputted from the light source on a light-receiving unit of the image sensor by the transfer optical system, and a processing unit, connected to the image sensor, configured to receive the image data, obtain a first optical intensity distribution along a first line that intersects with a trajectory of the target and a second optical intensity distribution along a second line that intersects with the trajectory, calculate a center of gravity position in the first optical intensity distribution and a center of gravity position in the second optical intensity distribution, and calculate an actual path of the target based on the calculated positions.
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公开(公告)号:US09841684B2
公开(公告)日:2017-12-12
申请号:US14629282
申请日:2015-02-23
Applicant: GIGAPHOTON INC.
Inventor: Hiroshi Tanaka , Akihiko Kurosu , Hiroyuki Masuda , Hideyuki Ochiai , Osamu Wakabayashi , Masato Moriya
IPC: G03F7/20 , H01L21/268 , H01L21/67 , H01L21/66
CPC classification number: G03F7/70483 , G03F7/70041 , G03F7/70058 , G03F7/70358 , H01L21/268 , H01L21/67115 , H01L21/67253 , H01L22/10 , H01L22/26
Abstract: A light source apparatus according to an embodiment may be used for an exposure apparatus which exposes a plurality of wafers by repeating a wafer exposure for exposing a total exposure area of each wafer. The wafer exposure may include a sequential execution of scanning exposures in which each divided area defined by dividing the total exposure area of each wafer is scanned by pulsed light. The apparatus may comprise: a light source controller configured to execute a control for outputting the pulsed light based on a luminescence trigger signal received from the exposure apparatus; a detector configured to detect a characteristic of the pulsed light; and a data collection processor configured to collect at least a piece of data in data included in a pulse light data group related to the pulsed light detected by the detector and a control data group related to the control, and execute a mapping process of mapping the collected data by at least one of scanning exposure basis and wafer exposure basis.
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