Multiple contact probe head disassembly method and system

    公开(公告)号:US10429414B2

    公开(公告)日:2019-10-01

    申请号:US15013106

    申请日:2016-02-02

    Abstract: A system and method for disassembling a multiple contact probe head including a plurality of contact probes positioned by a first die at a first end of the plurality of probes and a second die at a second end of the plurality of probes, are provided. The system may include a manifold configured to sealingly receive an opposing side of the first die from the second die; and a vacuum source operatively coupled to the manifold to apply a vacuum to an interior of the manifold applying a force to the plurality of contact probes in position in the first die across. Where the probes include a paramagnetic material, a magnetic source may be employed to hold the probes during disassembly.

    MULTIPLE CONTACT PROBE HEAD DISASSEMBLY METHOD AND SYSTEM

    公开(公告)号:US20170219631A1

    公开(公告)日:2017-08-03

    申请号:US15013106

    申请日:2016-02-02

    CPC classification number: G01R3/00 G01R1/073 G01R1/07357

    Abstract: A system and method for disassembling a multiple contact probe head including a plurality of contact probes positioned by a first die at a first end of the plurality of probes and a second die at a second end of the plurality of probes, are provided. The system may include a manifold configured to sealingly receive an opposing side of the first die from the second die; and a vacuum source operatively coupled to the manifold to apply a vacuum to an interior of the manifold applying a force to the plurality of contact probes in position in the first die across. Where the probes include a paramagnetic material, a magnetic source may be employed to hold the probes during disassembly.

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