-
公开(公告)号:US20170338226A1
公开(公告)日:2017-11-23
申请号:US15628984
申请日:2017-06-21
Applicant: GLOBALFOUNDRIES INC.
Inventor: Haigou Huang , Jinping Liu , Huang Liu , Taifong Chao
IPC: H01L27/088 , H01L21/3105 , H01L21/3115 , H01L21/8234
CPC classification number: H01L27/0886 , H01L21/28518 , H01L21/31053 , H01L21/31155 , H01L21/823431 , H01L21/823821 , H01L27/0924 , H01L29/66803 , H01L29/7856
Abstract: Various embodiments include methods and integrated circuit structures. In some cases, an integrated circuit (IC) structure includes: a substrate; a set of fin structures overlying the substrate, the set of fin structures including a substrate base and a silicide layer over the substrate base; an oxide layer located between adjacent fins in the set of fin structures; and a nitride layer over the set of fin structures, wherein a height of the nitride layer is substantially uniform across the set of fin structures.
-
公开(公告)号:US09754837B1
公开(公告)日:2017-09-05
申请号:US15160409
申请日:2016-05-20
Applicant: GLOBALFOUNDRIES INC.
Inventor: Haigou Huang , Jinping Liu , Huang Liu , Taifong Chao
IPC: H01L29/15 , H01L21/8234 , H01L21/3105 , H01L21/3115 , H01L21/02 , H01L29/66 , H01L29/78 , H01L21/285 , H01L21/8238 , H01L27/088 , H01L27/092
CPC classification number: H01L27/0886 , H01L21/28518 , H01L21/31053 , H01L21/31155 , H01L21/823431 , H01L21/823821 , H01L27/0924 , H01L29/66795 , H01L29/66803 , H01L29/785 , H01L29/7856
Abstract: Various embodiments include methods and integrated circuit structures. In some cases, a method of forming an integrated circuit structure can include: forming a mask over an oxide layer and an underlying set of fin structures, the set of fin structures including a plurality of fins each having a substrate base and a silicide layer over the substrate base; implanting the oxide layer through an opening in the mask; removing the mask; polishing the oxide layer overlying the set of fin structures after removing the mask to expose the set of fin structures; and forming a nitride layer over the set of fin structures.
-