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公开(公告)号:US09231079B1
公开(公告)日:2016-01-05
申请号:US14304017
申请日:2014-06-13
Applicant: GLOBALFOUNDRIES Inc.
Inventor: Johannes M. van Meer , Cuiqin Xu , Isabelle Ferain
IPC: H01L21/336 , H01L29/66 , H01L29/78 , H01L21/324 , H01L21/266
CPC classification number: H01L29/7847 , H01L21/26506 , H01L29/165 , H01L29/32 , H01L29/6659 , H01L29/66628
Abstract: One illustrative method disclosed herein includes, among other things, performing a source/drain extension ion implantation to form a doped extension implant region in the source/drain regions of the device, performing an ion implantation process on the source/drain regions with a Group VII material (e.g., fluorine), after performing the Group VII material ion implantation process, forming a capping material layer above the source/drain regions, and, with the capping material layer in position, performing an anneal process so as to form stacking faults in the source/drain regions.
Abstract translation: 本文公开的一种说明性方法包括进行源极/漏极扩展离子注入以在器件的源极/漏极区域中形成掺杂的延伸注入区域,在源极/漏极区域上执行离子注入工艺 VII材料(例如氟),在进行第VII族材料离子注入工艺之后,在源极/漏极区域上方形成覆盖材料层,并且在覆盖材料层就位的情况下,进行退火处理以形成堆垛层错 在源/漏区。
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公开(公告)号:US20150364570A1
公开(公告)日:2015-12-17
申请号:US14304017
申请日:2014-06-13
Applicant: GLOBALFOUNDRIES Inc.
Inventor: Johannes M. van Meer , Cuiqin Xu , Isabelle Ferain
IPC: H01L29/66 , H01L21/324 , H01L21/266 , H01L29/78
CPC classification number: H01L29/7847 , H01L21/26506 , H01L29/165 , H01L29/32 , H01L29/6659 , H01L29/66628
Abstract: One illustrative method disclosed herein includes, among other things, performing a source/drain extension ion implantation to form a doped extension implant region in the source/drain regions of the device, performing an ion implantation process on the source/drain regions with a Group VII material (e.g., fluorine), after performing the Group VII material ion implantation process, forming a capping material layer above the source/drain regions, and, with the capping material layer in position, performing an anneal process so as to form stacking faults in the source/drain regions.
Abstract translation: 本文公开的一种说明性方法包括进行源极/漏极扩展离子注入以在器件的源极/漏极区域中形成掺杂的延伸注入区域,在源极/漏极区域上执行离子注入工艺 VII材料(例如氟),在进行第VII族材料离子注入工艺之后,在源极/漏极区域上方形成覆盖材料层,并且在覆盖材料层就位的情况下,进行退火处理以形成堆垛层错 在源/漏区。
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